Low energy point reflection electron microscopy

John Spence; X. Zhang; Uwe Weierstall; J. M. Zuo; E. Munro; J. Rouse

doi:10.1142/S0218625X97000560

Low energy point reflection electron microscopy

John Spence, X. Zhang, Uwe Weierstall, J. M. Zuo, E. Munro, J. Rouse

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	577-587
Number of pages	11
Journal	Surface Review and Letters
Volume	4
Issue number	3
DOIs	https://doi.org/10.1142/S0218625X97000560
State	Published - Jun 1997

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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title = "Low energy point reflection electron microscopy",

author = "John Spence and X. Zhang and Uwe Weierstall and Zuo, {J. M.} and E. Munro and J. Rouse",

year = "1997",

month = jun,

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language = "English (US)",

volume = "4",

pages = "577--587",

journal = "Surface Review and Letters",

issn = "0218-625X",

publisher = "World Scientific Publishing Co. Pte Ltd",

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TY - JOUR

T1 - Low energy point reflection electron microscopy

AU - Spence, John

AU - Zhang, X.

AU - Weierstall, Uwe

AU - Zuo, J. M.

AU - Munro, E.

AU - Rouse, J.

PY - 1997/6

Y1 - 1997/6

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DO - 10.1142/S0218625X97000560

M3 - Article

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SN - 0218-625X

VL - 4

SP - 577

EP - 587

JO - Surface Review and Letters

JF - Surface Review and Letters

IS - 3

ER -

Low energy point reflection electron microscopy

ASJC Scopus subject areas

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