Low energy point reflection electron microscopy

John Spence, X. Zhang, Uwe Weierstall, J. M. Zuo, E. Munro, J. Rouse

Research output: Contribution to journalArticle

7 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)577-587
Number of pages11
JournalSurface Review and Letters
Volume4
Issue number3
StatePublished - Jun 1997

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Electron microscopy
electron microscopy
energy

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces

Cite this

Spence, J., Zhang, X., Weierstall, U., Zuo, J. M., Munro, E., & Rouse, J. (1997). Low energy point reflection electron microscopy. Surface Review and Letters, 4(3), 577-587.

Low energy point reflection electron microscopy. / Spence, John; Zhang, X.; Weierstall, Uwe; Zuo, J. M.; Munro, E.; Rouse, J.

In: Surface Review and Letters, Vol. 4, No. 3, 06.1997, p. 577-587.

Research output: Contribution to journalArticle

Spence, J, Zhang, X, Weierstall, U, Zuo, JM, Munro, E & Rouse, J 1997, 'Low energy point reflection electron microscopy', Surface Review and Letters, vol. 4, no. 3, pp. 577-587.
Spence, John ; Zhang, X. ; Weierstall, Uwe ; Zuo, J. M. ; Munro, E. ; Rouse, J. / Low energy point reflection electron microscopy. In: Surface Review and Letters. 1997 ; Vol. 4, No. 3. pp. 577-587.
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