Logarithm cofactor difference extrema method of mosfet's post-breakdown current and application to parameter extraction

Min Shi, Hongyu He, Guoan Zhang, Qin Chen, Cheng Wang, Jin He, Aixin Chen, Wen Wu, Yun Ye, Hailang Liang, Yu Cao, Wei Zhang, Ling Sun

Research output: Contribution to journalArticle

Abstract

This paper proposed an advanced logarithm cofactor difference operator (LogCDO) method to extract parameters of the MOS devices' post-breakdown current. The experimental results of the post breakdown current at different temperature are used to validity the LogCDO method. The postbreakdown current of MOS device is first equivalent to a double diode circuit model, and then the improved LogCDO method is applied to extract key parameters. The extraction results are consistent very well with the measured data even over a wide range of temperature.

Original languageEnglish (US)
Pages (from-to)669-672
Number of pages4
JournalJournal of Computational and Theoretical Nanoscience
Volume10
Issue number3
DOIs
StatePublished - Mar 1 2013
Externally publishedYes

Keywords

  • Logarithm cofactor difference extrema
  • MOS device
  • Parameter extraction
  • Post-breakdown current

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Computational Mathematics
  • Electrical and Electronic Engineering

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