Logarithm cofactor difference extrema method of mosfet's post-breakdown current and application to parameter extraction

Min Shi, Hongyu He, Guoan Zhang, Qin Chen, Cheng Wang, Jin He, Aixin Chen, Wen Wu, Yun Ye, Hailang Liang, Yu Cao, Wei Zhang, Ling Sun

Research output: Contribution to journalArticle

Abstract

This paper proposed an advanced logarithm cofactor difference operator (LogCDO) method to extract parameters of the MOS devices' post-breakdown current. The experimental results of the post breakdown current at different temperature are used to validity the LogCDO method. The postbreakdown current of MOS device is first equivalent to a double diode circuit model, and then the improved LogCDO method is applied to extract key parameters. The extraction results are consistent very well with the measured data even over a wide range of temperature.

Original languageEnglish (US)
Pages (from-to)669-672
Number of pages4
JournalJournal of Computational and Theoretical Nanoscience
Volume10
Issue number3
DOIs
StatePublished - Mar 2013
Externally publishedYes

Fingerprint

Cofactor
Parameter extraction
MOS devices
MOSFET
Difference Operator
range (extremes)
Extremum
logarithms
Logarithm
Breakdown
breakdown
operators
Diodes
Diode
Temperature
Networks (circuits)
diodes
temperature
Experimental Results
Range of data

Keywords

  • Logarithm cofactor difference extrema
  • MOS device
  • Parameter extraction
  • Post-breakdown current

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Computational Mathematics
  • Chemistry(all)

Cite this

Logarithm cofactor difference extrema method of mosfet's post-breakdown current and application to parameter extraction. / Shi, Min; He, Hongyu; Zhang, Guoan; Chen, Qin; Wang, Cheng; He, Jin; Chen, Aixin; Wu, Wen; Ye, Yun; Liang, Hailang; Cao, Yu; Zhang, Wei; Sun, Ling.

In: Journal of Computational and Theoretical Nanoscience, Vol. 10, No. 3, 03.2013, p. 669-672.

Research output: Contribution to journalArticle

Shi, Min ; He, Hongyu ; Zhang, Guoan ; Chen, Qin ; Wang, Cheng ; He, Jin ; Chen, Aixin ; Wu, Wen ; Ye, Yun ; Liang, Hailang ; Cao, Yu ; Zhang, Wei ; Sun, Ling. / Logarithm cofactor difference extrema method of mosfet's post-breakdown current and application to parameter extraction. In: Journal of Computational and Theoretical Nanoscience. 2013 ; Vol. 10, No. 3. pp. 669-672.
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AU - He, Jin

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AU - Wu, Wen

AU - Ye, Yun

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