Localization effects on quantification in axial and planar ALCHEMI

John Spence; M. Kuwabara; Y. Kim

doi:10.1016/0304-3991(88)90383-X

Localization effects on quantification in axial and planar ALCHEMI

John Spence, M. Kuwabara, Y. Kim

Physics

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

The effects of wave-function dimensionality and inelastic localization on ALCHEMI (Atom Location by Channeling-Enhanced Microanalysis) are studied. The original ALCHEMI equations are shown to hold for the case of partially delocalized excitations, provided that the thickness-averaged dynamical electron wavefield varies slowly over the localization volume. Experimental and theoretical comparisons of electron channeling in GaAs show that characteristic X-ray emission intensities in the axial orientation are more sensitive to variations in X-ray energy than are those in the planar (systematics) geometry. The effects of variations in localization are elucidated in a two-beam analysis, and methods for extending ALCHEMI to low-energy X-ray emission are discussed.

Original language	English (US)
Pages (from-to)	103-112
Number of pages	10
Journal	Ultramicroscopy
Volume	26
Issue number	1-2
DOIs	https://doi.org/10.1016/0304-3991(88)90383-X
State	Published - 1988

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/0304-3991(88)90383-X

Cite this

@article{d162d105cd614fc1abb26303671fcff0,

title = "Localization effects on quantification in axial and planar ALCHEMI",

abstract = "The effects of wave-function dimensionality and inelastic localization on ALCHEMI (Atom Location by Channeling-Enhanced Microanalysis) are studied. The original ALCHEMI equations are shown to hold for the case of partially delocalized excitations, provided that the thickness-averaged dynamical electron wavefield varies slowly over the localization volume. Experimental and theoretical comparisons of electron channeling in GaAs show that characteristic X-ray emission intensities in the axial orientation are more sensitive to variations in X-ray energy than are those in the planar (systematics) geometry. The effects of variations in localization are elucidated in a two-beam analysis, and methods for extending ALCHEMI to low-energy X-ray emission are discussed.",

author = "John Spence and M. Kuwabara and Y. Kim",

note = "Funding Information: We are grateful to Dr. J. Tafto and Dr. A. Eades for helpful discussions. This work was supported by NSF grant number DMR85-12784 and the facilities of the ASU/NSF National Center for High Resolution Electron Microscopy at Arizona State University.",

year = "1988",

doi = "10.1016/0304-3991(88)90383-X",

language = "English (US)",

volume = "26",

pages = "103--112",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Localization effects on quantification in axial and planar ALCHEMI

AU - Spence, John

AU - Kuwabara, M.

AU - Kim, Y.

N1 - Funding Information: We are grateful to Dr. J. Tafto and Dr. A. Eades for helpful discussions. This work was supported by NSF grant number DMR85-12784 and the facilities of the ASU/NSF National Center for High Resolution Electron Microscopy at Arizona State University.

PY - 1988

Y1 - 1988

N2 - The effects of wave-function dimensionality and inelastic localization on ALCHEMI (Atom Location by Channeling-Enhanced Microanalysis) are studied. The original ALCHEMI equations are shown to hold for the case of partially delocalized excitations, provided that the thickness-averaged dynamical electron wavefield varies slowly over the localization volume. Experimental and theoretical comparisons of electron channeling in GaAs show that characteristic X-ray emission intensities in the axial orientation are more sensitive to variations in X-ray energy than are those in the planar (systematics) geometry. The effects of variations in localization are elucidated in a two-beam analysis, and methods for extending ALCHEMI to low-energy X-ray emission are discussed.

AB - The effects of wave-function dimensionality and inelastic localization on ALCHEMI (Atom Location by Channeling-Enhanced Microanalysis) are studied. The original ALCHEMI equations are shown to hold for the case of partially delocalized excitations, provided that the thickness-averaged dynamical electron wavefield varies slowly over the localization volume. Experimental and theoretical comparisons of electron channeling in GaAs show that characteristic X-ray emission intensities in the axial orientation are more sensitive to variations in X-ray energy than are those in the planar (systematics) geometry. The effects of variations in localization are elucidated in a two-beam analysis, and methods for extending ALCHEMI to low-energy X-ray emission are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0024122810&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024122810&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(88)90383-X

DO - 10.1016/0304-3991(88)90383-X

M3 - Article

AN - SCOPUS:0024122810

SN - 0304-3991

VL - 26

SP - 103

EP - 112

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-2

ER -

Localization effects on quantification in axial and planar ALCHEMI

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this