Linear stochastic analysis of polluted insulator leakage current

Felix Amarh, George G. Karady, Raji Sundararajan

Research output: Contribution to journalArticle

69 Citations (Scopus)

Abstract

The measurement and analysis of leakage current (LC) for condition-based monitoring of, and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Results presented in the technical literature show that surface arcing of contaminated insulators causes significant variations in the magnitude and shape of the insulator's leakage current and several techniques have been proposed for analysis. This paper submits the results of applying linear stochastic and statistical (probabilistic) analysis as a signature analysis tool for flashover prediction. A new twist is presented based on statistical analysis of the leakage current envelope (rather than just instantaneous peak values), in particular, level crossings, mean exceedances over high thresholds, and extreme value analysis of the envelope. The analysis was performed offline using digitized samples of leakage current obtained from a data-acquisition (DAQ) system, which continuously scans the leakage current during flashover tests in a laboratory fog chamber.

Original languageEnglish (US)
Pages (from-to)1063-1069
Number of pages7
JournalIEEE Transactions on Power Delivery
Volume17
Issue number4
DOIs
StatePublished - Oct 2002

Fingerprint

Leakage currents
Flashover
Value engineering
Fog
Data acquisition
Statistical methods
Monitoring

Keywords

  • Envelope
  • Extreme value
  • Insulators
  • Leakage current
  • Pollution
  • Signature analysis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Linear stochastic analysis of polluted insulator leakage current. / Amarh, Felix; Karady, George G.; Sundararajan, Raji.

In: IEEE Transactions on Power Delivery, Vol. 17, No. 4, 10.2002, p. 1063-1069.

Research output: Contribution to journalArticle

Amarh, Felix ; Karady, George G. ; Sundararajan, Raji. / Linear stochastic analysis of polluted insulator leakage current. In: IEEE Transactions on Power Delivery. 2002 ; Vol. 17, No. 4. pp. 1063-1069.
@article{4a5ddab1c1b14b64b7d43db190dc339b,
title = "Linear stochastic analysis of polluted insulator leakage current",
abstract = "The measurement and analysis of leakage current (LC) for condition-based monitoring of, and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Results presented in the technical literature show that surface arcing of contaminated insulators causes significant variations in the magnitude and shape of the insulator's leakage current and several techniques have been proposed for analysis. This paper submits the results of applying linear stochastic and statistical (probabilistic) analysis as a signature analysis tool for flashover prediction. A new twist is presented based on statistical analysis of the leakage current envelope (rather than just instantaneous peak values), in particular, level crossings, mean exceedances over high thresholds, and extreme value analysis of the envelope. The analysis was performed offline using digitized samples of leakage current obtained from a data-acquisition (DAQ) system, which continuously scans the leakage current during flashover tests in a laboratory fog chamber.",
keywords = "Envelope, Extreme value, Insulators, Leakage current, Pollution, Signature analysis",
author = "Felix Amarh and Karady, {George G.} and Raji Sundararajan",
year = "2002",
month = "10",
doi = "10.1109/TPWRD.2002.800878",
language = "English (US)",
volume = "17",
pages = "1063--1069",
journal = "IEEE Transactions on Power Delivery",
issn = "0885-8977",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "4",

}

TY - JOUR

T1 - Linear stochastic analysis of polluted insulator leakage current

AU - Amarh, Felix

AU - Karady, George G.

AU - Sundararajan, Raji

PY - 2002/10

Y1 - 2002/10

N2 - The measurement and analysis of leakage current (LC) for condition-based monitoring of, and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Results presented in the technical literature show that surface arcing of contaminated insulators causes significant variations in the magnitude and shape of the insulator's leakage current and several techniques have been proposed for analysis. This paper submits the results of applying linear stochastic and statistical (probabilistic) analysis as a signature analysis tool for flashover prediction. A new twist is presented based on statistical analysis of the leakage current envelope (rather than just instantaneous peak values), in particular, level crossings, mean exceedances over high thresholds, and extreme value analysis of the envelope. The analysis was performed offline using digitized samples of leakage current obtained from a data-acquisition (DAQ) system, which continuously scans the leakage current during flashover tests in a laboratory fog chamber.

AB - The measurement and analysis of leakage current (LC) for condition-based monitoring of, and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Results presented in the technical literature show that surface arcing of contaminated insulators causes significant variations in the magnitude and shape of the insulator's leakage current and several techniques have been proposed for analysis. This paper submits the results of applying linear stochastic and statistical (probabilistic) analysis as a signature analysis tool for flashover prediction. A new twist is presented based on statistical analysis of the leakage current envelope (rather than just instantaneous peak values), in particular, level crossings, mean exceedances over high thresholds, and extreme value analysis of the envelope. The analysis was performed offline using digitized samples of leakage current obtained from a data-acquisition (DAQ) system, which continuously scans the leakage current during flashover tests in a laboratory fog chamber.

KW - Envelope

KW - Extreme value

KW - Insulators

KW - Leakage current

KW - Pollution

KW - Signature analysis

UR - http://www.scopus.com/inward/record.url?scp=0036815558&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036815558&partnerID=8YFLogxK

U2 - 10.1109/TPWRD.2002.800878

DO - 10.1109/TPWRD.2002.800878

M3 - Article

AN - SCOPUS:0036815558

VL - 17

SP - 1063

EP - 1069

JO - IEEE Transactions on Power Delivery

JF - IEEE Transactions on Power Delivery

SN - 0885-8977

IS - 4

ER -