Investigation of Tibetian Plateau varnish: New findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

Kurt A. Langworthy, David H. Krinsley, Ronald Dorn

Research output: Contribution to journalReview article

4 Scopus citations

Abstract

Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.

Original languageEnglish (US)
Pages (from-to)78-81
Number of pages4
JournalScanning
Volume33
Issue number2
DOIs
StatePublished - Mar 1 2011

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Keywords

  • EDS
  • FIB
  • STEM
  • Tibet
  • geology
  • nanoscale

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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