Introduction: The Otto Scherzer special issue on aberration-corrected electron microscopy

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Pages (from-to)	365
Number of pages	1
Journal	Microscopy and Microanalysis
Volume	16
Issue number	4
DOIs	https://doi.org/10.1017/S1431927610093700
State	Published - Aug 2010

ASJC Scopus subject areas

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title = "Introduction: The Otto Scherzer special issue on aberration-corrected electron microscopy",

author = "David Smith and Uli Dahmen",

year = "2010",

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