Original languageEnglish (US)
Pages (from-to)365
Number of pages1
JournalMicroscopy and Microanalysis
Volume16
Issue number4
DOIs
StatePublished - Aug 2010

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Aberrations
Electron microscopy
aberration
electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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Introduction : The Otto Scherzer special issue on aberration-corrected electron microscopy. / Smith, David; Dahmen, Uli.

In: Microscopy and Microanalysis, Vol. 16, No. 4, 08.2010, p. 365.

Research output: Contribution to journalArticle

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