Introduction: Opportunities, artifacts, and interpretation of aberration-corrected electron microscopy data

Phil Batson, David Smith

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Number of pages1
JournalMicroscopy and Microanalysis
Volume18
Issue number4
DOIs
StatePublished - Aug 1 2012

ASJC Scopus subject areas

  • Instrumentation

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