Original languageEnglish (US)
Pages (from-to)651
Number of pages1
JournalMicroscopy and Microanalysis
Volume18
Issue number4
DOIs
StatePublished - Aug 2012

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Aberrations
Electron microscopy
artifacts
aberration
electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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Introduction : Opportunities, artifacts, and interpretation of aberration-corrected electron microscopy data. / Batson, Phil; Smith, David.

In: Microscopy and Microanalysis, Vol. 18, No. 4, 08.2012, p. 651.

Research output: Contribution to journalArticle

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