Introduction: Opportunities, artifacts, and interpretation of aberration-corrected electron microscopy data

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Pages (from-to)	651
Number of pages	1
Journal	Microscopy and Microanalysis
Volume	18
Issue number	4
DOIs	https://doi.org/10.1017/S1431927612001493
State	Published - Aug 2012

ASJC Scopus subject areas

@article{e442dbabdeb14532893a5d447bac5ca0,

title = "Introduction: Opportunities, artifacts, and interpretation of aberration-corrected electron microscopy data",

author = "Phil Batson and David Smith",

year = "2012",

month = aug,

doi = "10.1017/S1431927612001493",

language = "English (US)",

volume = "18",

pages = "651",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "4",

}

TY - JOUR

T1 - Introduction

T2 - Opportunities, artifacts, and interpretation of aberration-corrected electron microscopy data

AU - Batson, Phil

AU - Smith, David

PY - 2012/8

Y1 - 2012/8

UR - http://www.scopus.com/inward/record.url?scp=84864769097&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84864769097&partnerID=8YFLogxK

U2 - 10.1017/S1431927612001493

DO - 10.1017/S1431927612001493

M3 - Editorial

AN - SCOPUS:84864769097

SN - 1431-9276

VL - 18

SP - 651

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 4

ER -