Identification at high mass resolution of the positive ion at m/z 19 produced by electron-stimulated desorption: F+ (rather than H 3 O+)

Peter Williams, Klaus Franzreb

Research output: Contribution to journalArticle

Abstract

Identification at high mass resolution of positive ion at m/z 19 produced by electron-stimulated desorption is presented. Negative ion formation by impact of approximately 100 eV electrons on F-containing molecules occurs primarily by ion-pair formation, for which the cross section is similar to or smaller than that for positive ion formation. It is found that direct electron attachment to a F atom to form F- has an low cross section, even at low electron energy. Authors also considered electron-stimulated desorption (ESD) of O + from TiO2 and advanced a model in which the O, initially residing in the ionic lattice as O2-, participates in an interatomic Auger transition involving a Ti 2p core level ionized by electron or photon impact. Studies have found that the average kinetic energy of the F2+ is twice that of F+.

Original languageEnglish (US)
Pages (from-to)622-624
Number of pages3
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume28
Issue number4
DOIs
StatePublished - Jul 1 2010

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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