Identification at high mass resolution of the positive ion at m/z 19 produced by electron-stimulated desorption: F+ (rather than H 3 O+)

Peter Williams, Klaus Franzreb

Research output: Contribution to journalArticle

Abstract

Identification at high mass resolution of positive ion at m/z 19 produced by electron-stimulated desorption is presented. Negative ion formation by impact of approximately 100 eV electrons on F-containing molecules occurs primarily by ion-pair formation, for which the cross section is similar to or smaller than that for positive ion formation. It is found that direct electron attachment to a F atom to form F- has an low cross section, even at low electron energy. Authors also considered electron-stimulated desorption (ESD) of O + from TiO2 and advanced a model in which the O, initially residing in the ionic lattice as O2-, participates in an interatomic Auger transition involving a Ti 2p core level ionized by electron or photon impact. Studies have found that the average kinetic energy of the F2+ is twice that of F+.

Original languageEnglish (US)
Pages (from-to)622-624
Number of pages3
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume28
Issue number4
DOIs
StatePublished - Jul 2010

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positive ions
Desorption
Positive ions
desorption
Electrons
electrons
electron attachment
cross sections
negative ions
electron impact
kinetic energy
electron energy
Core levels
photons
Kinetic energy
atoms
molecules
ions
Negative ions
Photons

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

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abstract = "Identification at high mass resolution of positive ion at m/z 19 produced by electron-stimulated desorption is presented. Negative ion formation by impact of approximately 100 eV electrons on F-containing molecules occurs primarily by ion-pair formation, for which the cross section is similar to or smaller than that for positive ion formation. It is found that direct electron attachment to a F atom to form F- has an low cross section, even at low electron energy. Authors also considered electron-stimulated desorption (ESD) of O + from TiO2 and advanced a model in which the O, initially residing in the ionic lattice as O2-, participates in an interatomic Auger transition involving a Ti 2p core level ionized by electron or photon impact. Studies have found that the average kinetic energy of the F2+ is twice that of F+.",
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N2 - Identification at high mass resolution of positive ion at m/z 19 produced by electron-stimulated desorption is presented. Negative ion formation by impact of approximately 100 eV electrons on F-containing molecules occurs primarily by ion-pair formation, for which the cross section is similar to or smaller than that for positive ion formation. It is found that direct electron attachment to a F atom to form F- has an low cross section, even at low electron energy. Authors also considered electron-stimulated desorption (ESD) of O + from TiO2 and advanced a model in which the O, initially residing in the ionic lattice as O2-, participates in an interatomic Auger transition involving a Ti 2p core level ionized by electron or photon impact. Studies have found that the average kinetic energy of the F2+ is twice that of F+.

AB - Identification at high mass resolution of positive ion at m/z 19 produced by electron-stimulated desorption is presented. Negative ion formation by impact of approximately 100 eV electrons on F-containing molecules occurs primarily by ion-pair formation, for which the cross section is similar to or smaller than that for positive ion formation. It is found that direct electron attachment to a F atom to form F- has an low cross section, even at low electron energy. Authors also considered electron-stimulated desorption (ESD) of O + from TiO2 and advanced a model in which the O, initially residing in the ionic lattice as O2-, participates in an interatomic Auger transition involving a Ti 2p core level ionized by electron or photon impact. Studies have found that the average kinetic energy of the F2+ is twice that of F+.

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