HREM, STEM, REM, SEM - and STM

John A. Venables; David Smith; John M. Cowley

doi:10.1016/0039-6028(87)90164-6

HREM, STEM, REM, SEM - and STM

John A. Venables, David Smith, John M. Cowley

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

Electron microscopy (EM) comes in a variety of forms using electrons with energies ranging from 〈1 keV to 〉1 MeV. Many of these techniques have a long history and are in a state of evolutionary development, which contrasts with the recent revolutionary development of scanning tunnelling microscopy (STM). This paper reviews some of the strengths and limitations of high resolution (HREM), scanning transmission (STEM), reflection (REM) and scanning (SEM) microscopies. Particular stress is laid on the interpretability of the images obtained, the compatibility with complementary analytical techniques, and applications in surface science. Possible instruments combining STM with forms of EM are considered briefly.

Original language	English (US)
Pages (from-to)	235-249
Number of pages	15
Journal	Surface Science
Volume	181
Issue number	1-2
DOIs	https://doi.org/10.1016/0039-6028(87)90164-6
State	Published - Mar 1 1987

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0039-6028(87)90164-6

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abstract = "Electron microscopy (EM) comes in a variety of forms using electrons with energies ranging from 〈1 keV to 〉1 MeV. Many of these techniques have a long history and are in a state of evolutionary development, which contrasts with the recent revolutionary development of scanning tunnelling microscopy (STM). This paper reviews some of the strengths and limitations of high resolution (HREM), scanning transmission (STEM), reflection (REM) and scanning (SEM) microscopies. Particular stress is laid on the interpretability of the images obtained, the compatibility with complementary analytical techniques, and applications in surface science. Possible instruments combining STM with forms of EM are considered briefly.",

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AU - Smith, David

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N2 - Electron microscopy (EM) comes in a variety of forms using electrons with energies ranging from 〈1 keV to 〉1 MeV. Many of these techniques have a long history and are in a state of evolutionary development, which contrasts with the recent revolutionary development of scanning tunnelling microscopy (STM). This paper reviews some of the strengths and limitations of high resolution (HREM), scanning transmission (STEM), reflection (REM) and scanning (SEM) microscopies. Particular stress is laid on the interpretability of the images obtained, the compatibility with complementary analytical techniques, and applications in surface science. Possible instruments combining STM with forms of EM are considered briefly.

AB - Electron microscopy (EM) comes in a variety of forms using electrons with energies ranging from 〈1 keV to 〉1 MeV. Many of these techniques have a long history and are in a state of evolutionary development, which contrasts with the recent revolutionary development of scanning tunnelling microscopy (STM). This paper reviews some of the strengths and limitations of high resolution (HREM), scanning transmission (STEM), reflection (REM) and scanning (SEM) microscopies. Particular stress is laid on the interpretability of the images obtained, the compatibility with complementary analytical techniques, and applications in surface science. Possible instruments combining STM with forms of EM are considered briefly.

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HREM, STEM, REM, SEM - and STM

Abstract

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