Hollow cone illumination for fast TEM, and outrunning damage with electrons

John Spence, G. Subramanian, P. Musumeci

    Research output: Contribution to journalArticle

    7 Citations (Scopus)

    Abstract

    We consider the possibility of imaging individual bioparticles using snapshot diffraction from femotsecond pulses, using a 3 MeV electron beam, based on the recent experimental performance of these coherent beams. Assuming that radiation damage can be outrun using 100 fs pulses (or less), we find that a sufficient number of electrons are scattered per particle only if the beam diameter can be matched to that of the particle (e.g. a virus), about three orders of magnitude smaller than has currently been demonstrated (and limited by space-charge effects). We then propose the use of the hollow-cone illumination mode for fast transmission electron microscope imaging, because it can provide full-field atomic resolution imaging despite the use of the large incoherent annular source required for an efficient photocathode, so that coherent illumination is not needed for high-resolution imaging. Reciprocity arguments are used to compare this full-field mode with data aquisition times and source brightness in scanning transmission electron microscopy.

    Original languageEnglish (US)
    Article number214003
    JournalJournal of Physics B: Atomic, Molecular and Optical Physics
    Volume48
    Issue number21
    DOIs
    StatePublished - Sep 23 2015

    Fingerprint

    hollow
    cones
    illumination
    damage
    transmission electron microscopy
    photocathodes
    viruses
    pulses
    radiation damage
    space charge
    brightness
    electrons
    electron microscopes
    electron beams
    scanning electron microscopy
    high resolution
    diffraction

    Keywords

    • fast imaging
    • femtosecond electron beams
    • radiation damage

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Atomic and Molecular Physics, and Optics

    Cite this

    Hollow cone illumination for fast TEM, and outrunning damage with electrons. / Spence, John; Subramanian, G.; Musumeci, P.

    In: Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 48, No. 21, 214003, 23.09.2015.

    Research output: Contribution to journalArticle

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