HIGH VOLTAGE RESOLUTION ELECTRON MICROSCOPY OF COMPOUND SEMICONDUCTORS.

David Smith; Fernando Ponce; T. Yamashita; R. Sinclair

HIGH VOLTAGE RESOLUTION ELECTRON MICROSCOPY OF COMPOUND SEMICONDUCTORS.

David Smith, Fernando Ponce, T. Yamashita, R. Sinclair

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Several II-VI compound semiconductors have been observed with a 500kv high resolution electron microscope. The lattice defects occurring in ZnTe and ZnSe are described and compared with those found in CdTe.

Original language	English (US)
Title of host publication	Lawrence Berkeley Laboratory (Report) LBL
Editors	R.M. Fisher, R. Gronsky, K.H. Westmacott
Pages	31-34
Number of pages	4
State	Published - 1983
Externally published	Yes

ASJC Scopus subject areas

General Engineering

Cite this

@inproceedings{da22b706ce9d4155b1b4a43fca08dd6a,

title = "HIGH VOLTAGE RESOLUTION ELECTRON MICROSCOPY OF COMPOUND SEMICONDUCTORS.",

abstract = "Several II-VI compound semiconductors have been observed with a 500kv high resolution electron microscope. The lattice defects occurring in ZnTe and ZnSe are described and compared with those found in CdTe.",

author = "David Smith and Fernando Ponce and T. Yamashita and R. Sinclair",

year = "1983",

language = "English (US)",

pages = "31--34",

editor = "R.M. Fisher and R. Gronsky and K.H. Westmacott",

booktitle = "Lawrence Berkeley Laboratory (Report) LBL",

}

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T1 - HIGH VOLTAGE RESOLUTION ELECTRON MICROSCOPY OF COMPOUND SEMICONDUCTORS.

AU - Smith, David

AU - Ponce, Fernando

AU - Yamashita, T.

AU - Sinclair, R.

PY - 1983

Y1 - 1983

N2 - Several II-VI compound semiconductors have been observed with a 500kv high resolution electron microscope. The lattice defects occurring in ZnTe and ZnSe are described and compared with those found in CdTe.

AB - Several II-VI compound semiconductors have been observed with a 500kv high resolution electron microscope. The lattice defects occurring in ZnTe and ZnSe are described and compared with those found in CdTe.

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M3 - Conference contribution

AN - SCOPUS:0020932230

SP - 31

EP - 34

BT - Lawrence Berkeley Laboratory (Report) LBL

A2 - Fisher, R.M.

A2 - Gronsky, R.

A2 - Westmacott, K.H.

ER -

HIGH VOLTAGE RESOLUTION ELECTRON MICROSCOPY OF COMPOUND SEMICONDUCTORS.

Abstract

ASJC Scopus subject areas

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