High resolution electron microscopic study of tin dioxide crystals

David J. Smith, L. A. Bursill, G. J. Wood

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

Crystals of Sb-doped tin dioxide have been examined by high resolution electron microscopy (≤2.3 Å point-to-point resolution) in [100], [001], and [1111] zone axes projections, and images of twin interfaces, inclined defects, and a possible crystallographic shear plane have been recorded. Image simulations confirmed that the metal atom rows have been clearly resolved in each of these three low-index projections for specific electron-optical conditions. Image observation and consideration of the possible atomic arrangements about a (011)-type twin interface suggested that this resulted from a glide operation given by 1 2 〈111〉 (011) and a very close match with an experimental through-focal series was obtained using computer image simulations. The structural determination of crystal defects by high resolution electron microscopy is briefly discussed.

Original languageEnglish (US)
Pages (from-to)51-69
Number of pages19
JournalJournal of Solid State Chemistry
Volume50
Issue number1
DOIs
StatePublished - Nov 1 1983
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Inorganic Chemistry
  • Materials Chemistry

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