Abstract
The room-temperature velocity-field characteristics of bulk gallium nitride test structures were determined using a pulsed voltage input and four point measurements. Many devices with etched constructions were measured. A peak electron velocity was attained at a field of 180kV/cm, in agreement with theoretical predictions.
Original language | English (US) |
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Pages (from-to) | 39-41 |
Number of pages | 3 |
Journal | Physica B: Condensed Matter |
Volume | 314 |
Issue number | 1-4 |
DOIs | |
State | Published - Mar 1 2002 |
Keywords
- Drift velocity
- GaN
- High-field transport
- Velocity-field characteristic
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering