Fundamental mechanisms of electroluminescence refrigeration in heterostructure light emitting diodes

S. Q. Yu, J. B. Wang, D. Ding, Shane Johnson, Dragica Vasileska, Yong-Hang Zhang

Research output: Chapter in Book/Report/Conference proceedingChapter

7 Citations (Scopus)

Abstract

The fundamental mechanisms of electroluminescence (EL) refrigeration in heterostructure light emitting diodes, is examined via carrier energy loss (and gain) during transport, relaxation, and recombination, where the contribution of electrons and holes are treated separately. This analysis shows that the EL refrigeration process is a combination of thermoelectric cooling that mainly occurs near the metal/semiconductor contacts and radiative recombination which mainly occurs in the active region. In semiconductors such as GaAs, electrons and holes make different contributions to the refrigeration processes as a result of their different densities of states.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6486
DOIs
StatePublished - 2007
EventLight-Emitting Diodes: Research, Manufacturing, and Applications XI - San Jose, CA, United States
Duration: Jan 24 2007Jan 25 2007

Other

OtherLight-Emitting Diodes: Research, Manufacturing, and Applications XI
CountryUnited States
CitySan Jose, CA
Period1/24/071/25/07

Fingerprint

Electroluminescence
Refrigeration
electroluminescence
Light emitting diodes
Heterojunctions
light emitting diodes
thermoelectric cooling
radiative recombination
Semiconductor materials
electrons
Electrons
energy dissipation
Energy dissipation
metals
Cooling
Metals

Keywords

  • Electroluminescence refrigeration
  • Semiconductor optical refrigeration

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Yu, S. Q., Wang, J. B., Ding, D., Johnson, S., Vasileska, D., & Zhang, Y-H. (2007). Fundamental mechanisms of electroluminescence refrigeration in heterostructure light emitting diodes. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6486). [648604] https://doi.org/10.1117/12.701301

Fundamental mechanisms of electroluminescence refrigeration in heterostructure light emitting diodes. / Yu, S. Q.; Wang, J. B.; Ding, D.; Johnson, Shane; Vasileska, Dragica; Zhang, Yong-Hang.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6486 2007. 648604.

Research output: Chapter in Book/Report/Conference proceedingChapter

Yu, SQ, Wang, JB, Ding, D, Johnson, S, Vasileska, D & Zhang, Y-H 2007, Fundamental mechanisms of electroluminescence refrigeration in heterostructure light emitting diodes. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6486, 648604, Light-Emitting Diodes: Research, Manufacturing, and Applications XI, San Jose, CA, United States, 1/24/07. https://doi.org/10.1117/12.701301
Yu SQ, Wang JB, Ding D, Johnson S, Vasileska D, Zhang Y-H. Fundamental mechanisms of electroluminescence refrigeration in heterostructure light emitting diodes. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6486. 2007. 648604 https://doi.org/10.1117/12.701301
Yu, S. Q. ; Wang, J. B. ; Ding, D. ; Johnson, Shane ; Vasileska, Dragica ; Zhang, Yong-Hang. / Fundamental mechanisms of electroluminescence refrigeration in heterostructure light emitting diodes. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6486 2007.
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