Atomic force microscope (AFM) imaging and cross-sectional analysis were used to document the shape evolution of Ge/Si(100) islands, grown by molecular beam epitaxy, as a function of growth conditions. Growth temperatures of 450, 550, 600, and 650°C with Ge coverages between 3.5 and 14.0 monolayers (ML) were investigated for a deposition rate of 1.4 ML/min. Low coverages produced small hut clusters which then evolved into dome clusters at higher coverages. These dome clusters eventually dislocated after further growth. Higher growth temperatures activated additional pathways for the Ge islands to relieve their strain such as Ge/Si intermixing and the formation of trenches around the islands. Our detailed AFM cross-sectional analysis indicated that dome clusters form several crystal facets in addition to those previously reported.
ASJC Scopus subject areas
- Physics and Astronomy(all)