Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits

Y. Deval, H. Lapuyade, P. Fouillat, Hugh Barnaby, F. Darracq, R. Briand, D. Lewis, R. D. Schrimpf

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This non-invasive approach can be applied to any electronic function. Laser irradiation is used to validate the technique, so that very high level of dose rates can be experimentally simulated.

Original languageEnglish (US)
Title of host publicationProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
EditorsJ.L. Autran
Pages237-242
Number of pages6
Volume1
Edition2
StatePublished - 2002
Externally publishedYes
Event2001 6th European Conference on Radiation and Its Effects on Components and Systems - Grenoble, France
Duration: Sep 10 2001Sep 14 2001

Other

Other2001 6th European Conference on Radiation and Its Effects on Components and Systems
CountryFrance
CityGrenoble
Period9/10/019/14/01

ASJC Scopus subject areas

  • Radiation

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