Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits

Y. Deval; H. Lapuyade; P. Fouillat; Hugh Barnaby; F. Darracq; R. Briand; D. Lewis; R. D. Schrimpf

Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits

Y. Deval, H. Lapuyade, P. Fouillat, Hugh Barnaby, F. Darracq, R. Briand, D. Lewis, R. D. Schrimpf

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This non-invasive approach can be applied to any electronic function. Laser irradiation is used to validate the technique, so that very high level of dose rates can be experimentally simulated.

Original language	English (US)
Title of host publication	Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Editors	J.L. Autran
Pages	237-242
Number of pages	6
Volume	1
Edition	2
State	Published - 2002
Externally published	Yes
Event	2001 6th European Conference on Radiation and Its Effects on Components and Systems - Grenoble, France Duration: Sep 10 2001 → Sep 14 2001

Other

Other	2001 6th European Conference on Radiation and Its Effects on Components and Systems
Country/Territory	France
City	Grenoble
Period	9/10/01 → 9/14/01

ASJC Scopus subject areas

Radiation

Cite this

Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits. / Deval, Y.; Lapuyade, H.; Fouillat, P. et al.
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. ed. / J.L. Autran. Vol. 1 2. ed. 2002. p. 237-242.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Deval, Y, Lapuyade, H, Fouillat, P, Barnaby, H, Darracq, F, Briand, R, Lewis, D & Schrimpf, RD 2002, Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits. in JL Autran (ed.), Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. 2 edn, vol. 1, pp. 237-242, 2001 6th European Conference on Radiation and Its Effects on Components and Systems, Grenoble, France, 9/10/01.

@inproceedings{7ac57d9417d1478bb50d7ac4d25c3080,

title = "Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits",

abstract = "A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This non-invasive approach can be applied to any electronic function. Laser irradiation is used to validate the technique, so that very high level of dose rates can be experimentally simulated.",

author = "Y. Deval and H. Lapuyade and P. Fouillat and Hugh Barnaby and F. Darracq and R. Briand and D. Lewis and Schrimpf, {R. D.}",

year = "2002",

language = "English (US)",

volume = "1",

pages = "237--242",

editor = "J.L. Autran",

booktitle = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",

edition = "2",

note = "2001 6th European Conference on Radiation and Its Effects on Components and Systems ; Conference date: 10-09-2001 Through 14-09-2001",

}

TY - GEN

T1 - Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits

AU - Deval, Y.

AU - Lapuyade, H.

AU - Fouillat, P.

AU - Barnaby, Hugh

AU - Darracq, F.

AU - Briand, R.

AU - Lewis, D.

AU - Schrimpf, R. D.

PY - 2002

Y1 - 2002

N2 - A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This non-invasive approach can be applied to any electronic function. Laser irradiation is used to validate the technique, so that very high level of dose rates can be experimentally simulated.

AB - A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This non-invasive approach can be applied to any electronic function. Laser irradiation is used to validate the technique, so that very high level of dose rates can be experimentally simulated.

UR - http://www.scopus.com/inward/record.url?scp=0036993219&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036993219&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0036993219

VL - 1

SP - 237

EP - 242

BT - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

A2 - Autran, J.L.

T2 - 2001 6th European Conference on Radiation and Its Effects on Components and Systems

Y2 - 10 September 2001 through 14 September 2001

ER -

Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits

Abstract

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ASJC Scopus subject areas

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