Erratum: Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320)

Sukesh Ram; Amber A. Chow; Shaurya Khanna; Nikhil C. Suresh; Franscesca J. Ark; Saaketh R. Narayan; Aashi R. Gurijala; Jack M. Day; Timothy Karcher; Robert J. Culbertson; Shawn D. Whaley; Karen L. Kavanagh; Nicole Herbots; S. Ram; A. A. Chow; S. Khanna; N. C. Suresh; F. J. Ark; S. R. Narayan; A. R. Gurijala; J. M. Day; T. Karcher; R. J. Culbertson; S. D. Whaley; K. L. Kavanagh; N. Herbots

doi:10.1557/adv.2019.368

Erratum: Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320)

Sukesh Ram, Amber A. Chow, Shaurya Khanna, Nikhil C. Suresh, Franscesca J. Ark, Saaketh R. Narayan, Aashi R. Gurijala, Jack M. Day, Timothy Karcher, Robert J. Culbertson, Shawn D. Whaley, Karen L. Kavanagh, Nicole Herbots, S. Ram, A. A. Chow, S. Khanna, N. C. Suresh, F. J. Ark, S. R. Narayan, A. R. GurijalaJ. M. Day, T. Karcher, R. J. Culbertson, S. D. Whaley, K. L. Kavanagh, N. Herbots

Physics

Research output: Contribution to journal › Comment/debate › peer-review

Abstract

In the title of this article1, the chemical formula "GaAs" was misspelled. This has been corrected in the original article. The publisher regrets this error.

Original language	English (US)
Pages (from-to)	2307
Number of pages	1
Journal	MRS Advances
Volume	4
Issue number	41-42
DOIs	https://doi.org/10.1557/adv.2019.368
State	Published - 2019

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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Ram, S., Chow, A. A., Khanna, S., Suresh, N. C., Ark, F. J., Narayan, S. R., Gurijala, A. R., Day, J. M., Karcher, T., Culbertson, R. J., Whaley, S. D., Kavanagh, K. L., Herbots, N., Ram, S., Chow, A. A., Khanna, S., Suresh, N. C., Ark, F. J., Narayan, S. R., ... Herbots, N. (2019). Erratum: Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320). MRS Advances, 4(41-42), 2307. https://doi.org/10.1557/adv.2019.368

Erratum: Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320). / Ram, Sukesh; Chow, Amber A.; Khanna, Shaurya et al.
In: MRS Advances, Vol. 4, No. 41-42, 2019, p. 2307.

Research output: Contribution to journal › Comment/debate › peer-review

Ram, S, Chow, AA, Khanna, S, Suresh, NC, Ark, FJ, Narayan, SR, Gurijala, AR, Day, JM, Karcher, T, Culbertson, RJ, Whaley, SD, Kavanagh, KL, Herbots, N, Ram, S, Chow, AA, Khanna, S, Suresh, NC, Ark, FJ, Narayan, SR, Gurijala, AR, Day, JM, Karcher, T, Culbertson, RJ, Whaley, SD, Kavanagh, KL & Herbots, N 2019, 'Erratum: Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320)', MRS Advances, vol. 4, no. 41-42, pp. 2307. https://doi.org/10.1557/adv.2019.368

Ram S, Chow AA, Khanna S, Suresh NC, Ark FJ, Narayan SR et al. Erratum: Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320). MRS Advances. 2019;4(41-42):2307. doi: 10.1557/adv.2019.368

Ram, Sukesh ; Chow, Amber A. ; Khanna, Shaurya et al. / Erratum : Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320). In: MRS Advances. 2019 ; Vol. 4, No. 41-42. pp. 2307.

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title = "Erratum: Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320)",

abstract = "In the title of this article1, the chemical formula {"}GaAs{"} was misspelled. This has been corrected in the original article. The publisher regrets this error.",

author = "Sukesh Ram and Chow, {Amber A.} and Shaurya Khanna and Suresh, {Nikhil C.} and Ark, {Franscesca J.} and Narayan, {Saaketh R.} and Gurijala, {Aashi R.} and Day, {Jack M.} and Timothy Karcher and Culbertson, {Robert J.} and Whaley, {Shawn D.} and Kavanagh, {Karen L.} and Nicole Herbots and S. Ram and Chow, {A. A.} and S. Khanna and Suresh, {N. C.} and Ark, {F. J.} and Narayan, {S. R.} and Gurijala, {A. R.} and Day, {J. M.} and T. Karcher and Culbertson, {R. J.} and Whaley, {S. D.} and Kavanagh, {K. L.} and N. Herbots",

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year = "2019",

doi = "10.1557/adv.2019.368",

language = "English (US)",

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pages = "2307",

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AU - Ram, Sukesh

AU - Chow, Amber A.

AU - Khanna, Shaurya

AU - Suresh, Nikhil C.

AU - Ark, Franscesca J.

AU - Narayan, Saaketh R.

AU - Gurijala, Aashi R.

AU - Day, Jack M.

AU - Karcher, Timothy

AU - Culbertson, Robert J.

AU - Whaley, Shawn D.

AU - Kavanagh, Karen L.

AU - Herbots, Nicole

AU - Ram, S.

AU - Chow, A. A.

AU - Khanna, S.

AU - Suresh, N. C.

AU - Ark, F. J.

AU - Narayan, S. R.

AU - Gurijala, A. R.

AU - Day, J. M.

AU - Karcher, T.

AU - Culbertson, R. J.

AU - Whaley, S. D.

AU - Kavanagh, K. L.

AU - Herbots, N.

PY - 2019

Y1 - 2019

N2 - In the title of this article1, the chemical formula "GaAs" was misspelled. This has been corrected in the original article. The publisher regrets this error.

AB - In the title of this article1, the chemical formula "GaAs" was misspelled. This has been corrected in the original article. The publisher regrets this error.

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Erratum: Understanding GaAs Native Oxides by Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing (MRS Advances (2019) 1 DOI: 10.1557/adv.2019.320)

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