Encapsulation of Ag films on SiO2 by Ti reactions using Ag-Ti alloy/bilayer structures and an NH3 ambient

Terry Alford, Daniel Adams, T. Laursen, B. Manfred Ullrich

Research output: Contribution to journalArticle

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Abstract

Thin encapsulated silver films have been prepared on oxidized silicon by nitridation of ∼200-nm-thick Ag-19 at.% Ti alloy films and Ag(120 nm)/Ti(22 nm) at 300-700°C in an ammonia ambient. The encapsulation process has been studied in detail by Rutherford backscattering, and scanning Auger and secondary-ion-mass spectrometry, which showed that Ti-nitride and Ti-oxide-silicide formation take place at the surface and the Ag-Ti/SiO2 interface, respectively. Four-point-probe analysis of the alloy films suggests that the resistivity is controlled by the residual Ti concentration. Resistivity values of ∼4 μ cm were measured in encapsulated Ag alloy films with initial low Ti concentrations. The annealed bilayer structure had minimal Ti accumulations in Ag and the resistivity values were comparable to that of the as-deposited Ag (∼3 μcm).

Original languageEnglish (US)
Pages (from-to)3251-3253
Number of pages3
JournalApplied Physics Letters
Volume68
Issue number23
DOIs
StatePublished - Dec 1 1996

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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