Abstract

A pulsed voltage bias (PVB) method is demonstrated to eliminate artifacts in external quantum efficiency (EQE) measurements of multijunction solar cells that are caused by the shunt effect or the combined effects of shunt and luminescence coupling. This method uses a PVB superimposed on the dc voltage and light biases in conventional EQE measurements. The PVB method is compared with the recently reported pulsed light bias (PLB) method and unity rule. It is found that the PVB method has a similar accuracy as the PLB method, while the unity rule shows a larger discrepancy between the measurement results and the true EQE under certain conditions. Experimental results show that, with either the PVB or PLB method, one only needs to measure the EQE at one wavelength point and scale accordingly at the other wavelengths to obtain the entire spectrum in the wavelength range of the subcell under test, making both methods convenient to use in practice.

Original languageEnglish (US)
Article number6468054
Pages (from-to)769-775
Number of pages7
JournalIEEE Journal of Photovoltaics
Volume3
Issue number2
DOIs
StatePublished - 2013

Fingerprint

Bias voltage
Quantum efficiency
artifacts
quantum efficiency
elimination
solar cells
electric potential
Wavelength
shunts
unity
Luminescence
wavelengths
Multi-junction solar cells
Electric potential
luminescence

Keywords

  • External quantum efficiency
  • luminescence coupling
  • measurement artifacts
  • multijunction solar cell
  • pulsed light bias
  • pulsed voltage bias
  • shunt
  • unity rule

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Elimination of artifacts in external quantum efficiency measurements of multijunction solar cells using a pulsed voltage bias. / Li, Jing Jing; Allen, Charles R.; Lim, Swee Hoe; Zhang, Yong-Hang.

In: IEEE Journal of Photovoltaics, Vol. 3, No. 2, 6468054, 2013, p. 769-775.

Research output: Contribution to journalArticle

@article{f59ef067ec054a1ea18456f3c4859c6c,
title = "Elimination of artifacts in external quantum efficiency measurements of multijunction solar cells using a pulsed voltage bias",
abstract = "A pulsed voltage bias (PVB) method is demonstrated to eliminate artifacts in external quantum efficiency (EQE) measurements of multijunction solar cells that are caused by the shunt effect or the combined effects of shunt and luminescence coupling. This method uses a PVB superimposed on the dc voltage and light biases in conventional EQE measurements. The PVB method is compared with the recently reported pulsed light bias (PLB) method and unity rule. It is found that the PVB method has a similar accuracy as the PLB method, while the unity rule shows a larger discrepancy between the measurement results and the true EQE under certain conditions. Experimental results show that, with either the PVB or PLB method, one only needs to measure the EQE at one wavelength point and scale accordingly at the other wavelengths to obtain the entire spectrum in the wavelength range of the subcell under test, making both methods convenient to use in practice.",
keywords = "External quantum efficiency, luminescence coupling, measurement artifacts, multijunction solar cell, pulsed light bias, pulsed voltage bias, shunt, unity rule",
author = "Li, {Jing Jing} and Allen, {Charles R.} and Lim, {Swee Hoe} and Yong-Hang Zhang",
year = "2013",
doi = "10.1109/JPHOTOV.2013.2242959",
language = "English (US)",
volume = "3",
pages = "769--775",
journal = "IEEE Journal of Photovoltaics",
issn = "2156-3381",
publisher = "IEEE Electron Devices Society",
number = "2",

}

TY - JOUR

T1 - Elimination of artifacts in external quantum efficiency measurements of multijunction solar cells using a pulsed voltage bias

AU - Li, Jing Jing

AU - Allen, Charles R.

AU - Lim, Swee Hoe

AU - Zhang, Yong-Hang

PY - 2013

Y1 - 2013

N2 - A pulsed voltage bias (PVB) method is demonstrated to eliminate artifacts in external quantum efficiency (EQE) measurements of multijunction solar cells that are caused by the shunt effect or the combined effects of shunt and luminescence coupling. This method uses a PVB superimposed on the dc voltage and light biases in conventional EQE measurements. The PVB method is compared with the recently reported pulsed light bias (PLB) method and unity rule. It is found that the PVB method has a similar accuracy as the PLB method, while the unity rule shows a larger discrepancy between the measurement results and the true EQE under certain conditions. Experimental results show that, with either the PVB or PLB method, one only needs to measure the EQE at one wavelength point and scale accordingly at the other wavelengths to obtain the entire spectrum in the wavelength range of the subcell under test, making both methods convenient to use in practice.

AB - A pulsed voltage bias (PVB) method is demonstrated to eliminate artifacts in external quantum efficiency (EQE) measurements of multijunction solar cells that are caused by the shunt effect or the combined effects of shunt and luminescence coupling. This method uses a PVB superimposed on the dc voltage and light biases in conventional EQE measurements. The PVB method is compared with the recently reported pulsed light bias (PLB) method and unity rule. It is found that the PVB method has a similar accuracy as the PLB method, while the unity rule shows a larger discrepancy between the measurement results and the true EQE under certain conditions. Experimental results show that, with either the PVB or PLB method, one only needs to measure the EQE at one wavelength point and scale accordingly at the other wavelengths to obtain the entire spectrum in the wavelength range of the subcell under test, making both methods convenient to use in practice.

KW - External quantum efficiency

KW - luminescence coupling

KW - measurement artifacts

KW - multijunction solar cell

KW - pulsed light bias

KW - pulsed voltage bias

KW - shunt

KW - unity rule

UR - http://www.scopus.com/inward/record.url?scp=84875587176&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84875587176&partnerID=8YFLogxK

U2 - 10.1109/JPHOTOV.2013.2242959

DO - 10.1109/JPHOTOV.2013.2242959

M3 - Article

VL - 3

SP - 769

EP - 775

JO - IEEE Journal of Photovoltaics

JF - IEEE Journal of Photovoltaics

SN - 2156-3381

IS - 2

M1 - 6468054

ER -