Fingerprint
Dive into the research topics of 'Electronic properties of the Zr-ZrO 2-SiO 2-Si (100) gate stack structure'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Electronic properties of the Zr-ZrO 2-SiO 2-Si (100) gate stack structure
C. C. Fulton, G. Lucovsky, R. J. Nemanich
Research output: Contribution to journal › Article › peer-review
65
Scopus
citations