Electron diffraction of thin-film pentacene

J. S. Wu, John Spence

Research output: Contribution to journalArticle

49 Citations (Scopus)

Abstract

The structure of pentacene thin films deposited on NaCl substrates have been studied by electron diffraction. The lattice parameters of a 'thin film' phase [a = 6.1 (1), b = 7.6 (1), c = 15.3 (3) Å, α = 81.0 (16), β = 85.0 (17), γ = 89.5 (9)°] were determined using a series of diffraction patterns obtained by tilting the crystal in the electron microscope. This phase has a (001) d spacing of 15.1 (3) Å. The packing of molecules in the structure is discussed.

Original languageEnglish (US)
Pages (from-to)78-81
Number of pages4
JournalJournal of Applied Crystallography
Volume37
Issue number1
DOIs
StatePublished - Feb 2004

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Electron diffraction
electron diffraction
Electrons
Thin films
thin films
Diffraction patterns
Lattice constants
lattice parameters
Electron microscopes
diffraction patterns
electron microscopes
spacing
Crystals
Molecules
Substrates
crystals
molecules
pentacene

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Structural Biology

Cite this

Electron diffraction of thin-film pentacene. / Wu, J. S.; Spence, John.

In: Journal of Applied Crystallography, Vol. 37, No. 1, 02.2004, p. 78-81.

Research output: Contribution to journalArticle

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