Electron diffraction of thin-film pentacene

J. S. Wu, John Spence

Research output: Contribution to journalArticle

50 Scopus citations

Abstract

The structure of pentacene thin films deposited on NaCl substrates have been studied by electron diffraction. The lattice parameters of a 'thin film' phase [a = 6.1 (1), b = 7.6 (1), c = 15.3 (3) Å, α = 81.0 (16), β = 85.0 (17), γ = 89.5 (9)°] were determined using a series of diffraction patterns obtained by tilting the crystal in the electron microscope. This phase has a (001) d spacing of 15.1 (3) Å. The packing of molecules in the structure is discussed.

Original languageEnglish (US)
Pages (from-to)78-81
Number of pages4
JournalJournal of Applied Crystallography
Volume37
Issue number1
DOIs
StatePublished - Feb 1 2004

    Fingerprint

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

Cite this