Effect of the Si substrate structure on the growth of two-dimensional thin Ag films

C. S. Jiang, Hongbin Yu, C. K. Shih, Ph Ebert

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

We investigated and compared the growth morphology of Ag films deposited on different Si surfaces at low temperatures and annealed at room temperature with scanning tunneling microscopy. Ag films on clean Si(1 1 1) 7 × 7 and Si(0 0 1) 2 × 1 surfaces exhibit with increasing film thickness: clusters (interconnected), islands with flat top terraces, flat films with voids extending down to the wetting layer, and flat films with no voids. The Ag films on Au-reconstructed Si(1 1 1) surfaces exhibit the same trend, with the exception that the initial islands exhibit no well defined heights. The growth morphology observed does not allow the identification of a single critical or minimum thickness of the Ag film as expected in the electronic growth model. Two different critical thicknesses are defined, which are higher for Si(0 0 1) 2 × 1 than for Si(1 1 1) 7 × 7 surfaces. The importance of surface states and pinning levels within the electronic growth model is discussed.

Original languageEnglish (US)
Pages (from-to)63-71
Number of pages9
JournalSurface Science
Volume518
Issue number1-2
DOIs
StatePublished - Oct 10 2002
Externally publishedYes

Keywords

  • Metal-semiconductor interfaces
  • Metal-semiconductor non-magnetic thin film structures
  • Quantum effects
  • Scanning tunneling microscopy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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