Effect of amorphous layers on the interpretation of restored exit waves

S. Van Aert; L. Y. Chang; S. Bals; A. I. Kirkland; G. Van Tendeloo

doi:10.1016/j.ultramic.2008.10.024

Effect of amorphous layers on the interpretation of restored exit waves

S. Van Aert, L. Y. Chang, S. Bals, A. I. Kirkland, G. Van Tendeloo

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of 〈 0 0 1 〉SrTiO₃ with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.

Original language	English (US)
Pages (from-to)	237-246
Number of pages	10
Journal	Ultramicroscopy
Volume	109
Issue number	3
DOIs	https://doi.org/10.1016/j.ultramic.2008.10.024
State	Published - Feb 2009
Externally published	Yes

Keywords

Exit wave restoration
High-resolution transmission electron microscopy (HRTEM)
Model-based fitting

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/j.ultramic.2008.10.024

Cite this

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title = "Effect of amorphous layers on the interpretation of restored exit waves",

abstract = "The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of 〈 0 0 1 〉SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.",

keywords = "Exit wave restoration, High-resolution transmission electron microscopy (HRTEM), Model-based fitting",

author = "Aert, {S. Van} and Chang, {L. Y.} and S. Bals and Kirkland, {A. I.} and Tendeloo, {G. Van}",

note = "Funding Information: S. Van Aert and S. Bals gratefully acknowledge financial support from the Fund for Scientific Research—Flanders (FWO). Financial support from EPSRC (Grant GR/S83968/01) is gratefully acknowledged. Financial support from the European Union for the Framework 6 program under a contract for an Integrated Infrastructure Initiative (Reference 026019 ESTEEM) is acknowledged. ",

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doi = "10.1016/j.ultramic.2008.10.024",

language = "English (US)",

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pages = "237--246",

journal = "Ultramicroscopy",

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AU - Aert, S. Van

AU - Chang, L. Y.

AU - Bals, S.

AU - Kirkland, A. I.

AU - Tendeloo, G. Van

N1 - Funding Information: S. Van Aert and S. Bals gratefully acknowledge financial support from the Fund for Scientific Research—Flanders (FWO). Financial support from EPSRC (Grant GR/S83968/01) is gratefully acknowledged. Financial support from the European Union for the Framework 6 program under a contract for an Integrated Infrastructure Initiative (Reference 026019 ESTEEM) is acknowledged.

PY - 2009/2

Y1 - 2009/2

N2 - The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of 〈 0 0 1 〉SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.

AB - The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of 〈 0 0 1 〉SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.

KW - Exit wave restoration

KW - High-resolution transmission electron microscopy (HRTEM)

KW - Model-based fitting

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EP - 246

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3

ER -

Effect of amorphous layers on the interpretation of restored exit waves

Abstract

Keywords

ASJC Scopus subject areas

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