Effect of amorphous layers on the interpretation of restored exit waves

S. Van Aert, Lan-Yun Chang, S. Bals, A. I. Kirkland, G. Van Tendeloo

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of 〈 0 0 1 〉SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.

Original languageEnglish (US)
Pages (from-to)237-246
Number of pages10
JournalUltramicroscopy
Volume109
Issue number3
DOIs
StatePublished - Feb 1 2009
Externally publishedYes

Fingerprint

restoration
Restoration
Position measurement
Amorphous carbon
computer programs
carbon
strontium titanium oxide

Keywords

  • Exit wave restoration
  • High-resolution transmission electron microscopy (HRTEM)
  • Model-based fitting

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

Cite this

Effect of amorphous layers on the interpretation of restored exit waves. / Aert, S. Van; Chang, Lan-Yun; Bals, S.; Kirkland, A. I.; Tendeloo, G. Van.

In: Ultramicroscopy, Vol. 109, No. 3, 01.02.2009, p. 237-246.

Research output: Contribution to journalArticle

Aert, S. Van ; Chang, Lan-Yun ; Bals, S. ; Kirkland, A. I. ; Tendeloo, G. Van. / Effect of amorphous layers on the interpretation of restored exit waves. In: Ultramicroscopy. 2009 ; Vol. 109, No. 3. pp. 237-246.
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