Discrete tunneling current fluctuations in metal-water-metal tunnel junctions

S. Boussaad; B. Q. Xu; L. A. Nagahara; I. Amlani; W. Schmickler; R. Tsui; Nongjian Tao

doi:10.1063/1.1566933

Discrete tunneling current fluctuations in metal-water-metal tunnel junctions

S. Boussaad, B. Q. Xu, L. A. Nagahara, I. Amlani, W. Schmickler, R. Tsui, Nongjian Tao

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20 Scopus citations

Abstract

A random fluctuation in the tunneling current of a metal-water-metal junction between two discrete levels was observed. Fluctuations were studied as a function of the tunnel gap width and applied vias voltage in pure water, organic solvent, and in the presence different ions of various concentrations. Results were explained by the existence of a low-lying local state in the water layer between the metal electrodes.

Original language	English (US)
Pages (from-to)	8891-8897
Number of pages	7
Journal	Journal of Chemical Physics
Volume	118
Issue number	19
DOIs	https://doi.org/10.1063/1.1566933
State	Published - May 15 2003

ASJC Scopus subject areas

General Physics and Astronomy
Physical and Theoretical Chemistry

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10.1063/1.1566933

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@article{555c59a64e8c4033bc4938b80d9cba0d,

title = "Discrete tunneling current fluctuations in metal-water-metal tunnel junctions",

abstract = "A random fluctuation in the tunneling current of a metal-water-metal junction between two discrete levels was observed. Fluctuations were studied as a function of the tunnel gap width and applied vias voltage in pure water, organic solvent, and in the presence different ions of various concentrations. Results were explained by the existence of a low-lying local state in the water layer between the metal electrodes.",

author = "S. Boussaad and Xu, {B. Q.} and Nagahara, {L. A.} and I. Amlani and W. Schmickler and R. Tsui and Nongjian Tao",

year = "2003",

month = may,

day = "15",

doi = "10.1063/1.1566933",

language = "English (US)",

volume = "118",

pages = "8891--8897",

journal = "Journal of Chemical Physics",

issn = "0021-9606",

publisher = "American Institute of Physics Publising LLC",

number = "19",

}

TY - JOUR

T1 - Discrete tunneling current fluctuations in metal-water-metal tunnel junctions

AU - Boussaad, S.

AU - Xu, B. Q.

AU - Nagahara, L. A.

AU - Amlani, I.

AU - Schmickler, W.

AU - Tsui, R.

AU - Tao, Nongjian

PY - 2003/5/15

Y1 - 2003/5/15

N2 - A random fluctuation in the tunneling current of a metal-water-metal junction between two discrete levels was observed. Fluctuations were studied as a function of the tunnel gap width and applied vias voltage in pure water, organic solvent, and in the presence different ions of various concentrations. Results were explained by the existence of a low-lying local state in the water layer between the metal electrodes.

AB - A random fluctuation in the tunneling current of a metal-water-metal junction between two discrete levels was observed. Fluctuations were studied as a function of the tunnel gap width and applied vias voltage in pure water, organic solvent, and in the presence different ions of various concentrations. Results were explained by the existence of a low-lying local state in the water layer between the metal electrodes.

UR - http://www.scopus.com/inward/record.url?scp=0038205364&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0038205364&partnerID=8YFLogxK

U2 - 10.1063/1.1566933

DO - 10.1063/1.1566933

M3 - Article

AN - SCOPUS:0038205364

SN - 0021-9606

VL - 118

SP - 8891

EP - 8897

JO - Journal of Chemical Physics

JF - Journal of Chemical Physics

IS - 19

ER -

Discrete tunneling current fluctuations in metal-water-metal tunnel junctions

Abstract

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