Direct quantitative measurement of compositional enrichment and variations in InyGa1-yAs quantum dots

Peter Crozier, M. Catalano, R. Cingolani, A. Passaseo

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

Assessment of the composition of quantum dots on the nanoscale is crucial for a deeper understanding of both the growth mechanisms and the properties of these materials. In this letter, we discuss a direct method to obtain a quantitative evaluation of the In variation across nanometer-sized InGaAs quantum dots embedded in a GaAs matrix, by means of electron energy-loss spectroscopy in a scanning transmission electron microscope.

Original languageEnglish (US)
Pages (from-to)3170-3172
Number of pages3
JournalApplied Physics Letters
Volume79
Issue number19
DOIs
StatePublished - Nov 5 2001

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quantum dots
electron microscopes
energy dissipation
electron energy
scanning
evaluation
matrices
spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Direct quantitative measurement of compositional enrichment and variations in InyGa1-yAs quantum dots. / Crozier, Peter; Catalano, M.; Cingolani, R.; Passaseo, A.

In: Applied Physics Letters, Vol. 79, No. 19, 05.11.2001, p. 3170-3172.

Research output: Contribution to journalArticle

Crozier, Peter ; Catalano, M. ; Cingolani, R. ; Passaseo, A. / Direct quantitative measurement of compositional enrichment and variations in InyGa1-yAs quantum dots. In: Applied Physics Letters. 2001 ; Vol. 79, No. 19. pp. 3170-3172.
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