Direct correlation of surface morphology with electron emission sites for intrinsic nanocrystalline diamond films

F. A.M. Köck, J. M. Garguilo, R. J. Nemanich

Research output: Contribution to journalArticle

14 Scopus citations

Abstract

Field emission properties of nanocrystalline diamond films show low turn-on fields resulting in significant electron emission at low applied fields originating from individual sites with an emission site density of ∼104/cm2. We have employed a high resolution electron emission microscope operating in field emission mode to image the spatial distribution of emission sites for intrinsic nanocrystalline diamond thin films. The location of individual emission sites has been directly correlated to the surface morphology probed by scanning electron microscopy. Surface topography measurements show fine structured features consisting of micron and submicron domains separated by grain boundaries. No preferred topographic features that would account for field emission can be detected suggesting that the electronic structure of the grains and their boundaries under a high electric field has to be considered in order to account for the observed emission characteristics.

Original languageEnglish (US)
Pages (from-to)1022-1025
Number of pages4
JournalDiamond and Related Materials
Volume13
Issue number4-8
DOIs
StatePublished - Apr 1 2004
Externally publishedYes

Keywords

  • Field emission
  • Nanocrystalline
  • Plasma chemical vapor deposition

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Mechanical Engineering
  • Materials Chemistry
  • Electrical and Electronic Engineering

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