Abstract
The diffusion equation has received increasing attention in the fields of image analysis and computer vision for tasks such as image smoothing, image enhancement, feature extraction as well as dominant point detection. In this paper, the diffusion equation is applied to the inspection of surface mounted devices (SMD). It is shown experimentally that diffusion-equation-based methods could render very good discriminating features. The inspection experiments show that the correct inspection rate of the diffusion-equation-based method is very high for both training boards and test boards.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 157-166 |
| Number of pages | 10 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3029 |
| DOIs | |
| State | Published - Apr 15 1997 |
| Externally published | Yes |
| Event | Machine Vision Applications in Industrial Inspection V 1997 - San Jose, United States Duration: Feb 8 1997 → Feb 14 1997 |
Keywords
- Automated visual inspection (AVI)
- Component-absent
- Component-present
- Diffusion equation
- Lifetime
- Multiscale
- Surface mounted devices inspection
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering