Diffusion equation and its application to SMD inspection

Bing Cheng Li, J. Rene Villalobos, M. Gallegos, S. Cabrera

Research output: Contribution to journalConference articlepeer-review

Abstract

The diffusion equation has received increasing attention in the fields of image analysis and computer vision for tasks such as image smoothing, image enhancement, feature extraction as well as dominant point detection. In this paper, the diffusion equation is applied to the inspection of surface mounted devices (SMD). It is shown experimentally that diffusion-equation-based methods could render very good discriminating features. The inspection experiments show that the correct inspection rate of the diffusion-equation-based method is very high for both training boards and test boards.

Original languageEnglish (US)
Pages (from-to)157-166
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3029
DOIs
StatePublished - Apr 15 1997
Externally publishedYes
EventMachine Vision Applications in Industrial Inspection V 1997 - San Jose, United States
Duration: Feb 8 1997Feb 14 1997

Keywords

  • Automated visual inspection (AVI)
  • Component-absent
  • Component-present
  • Diffusion equation
  • Lifetime
  • Multiscale
  • Surface mounted devices inspection

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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