@article{ee987496199d4b0687ba99cdd6ae6148,
title = "Development of a new methodology to model the synergistic effects between TID and ASETs",
abstract = "A high level model is developed using circuit analysis to predict the synergy effect observed on a three stages operational amplifier. This model makes possible to explain and to predict the analog single event transients propagation in circuitry. The effect of total ionizing dose is taken into account by varying the model parameters using the monitoring of the usual supply current induced degradation of the operational amplifier.",
keywords = "Bipolar analog integrated circuits, integrated circuit modeling, ionizing dose, single event transient, transient propagation, transient response",
author = "Roche, {Nicolas J.H.} and L. Dusseau and J. Boch and Velo, {Y. Gonzalez} and Vaill{\'e}, {J. R.} and F. Saign{\'e} and G. Auriel and B. Azais and Buchner, {S. P.} and R. Marec and P. Calvel and F. Bezerra",
note = "Funding Information: Manuscript received September 11, 2009; revised January 04, 2010; accepted January 27, 2010. Date of current version August 18, 2010. This work was supported in part by the D{\'e}l{\'e}gation G{\'e}n{\'e}rale pour l{\textquoteright}Armement, the Centre National d{\textquoteright}Etudes Spatiales and Thal{\`e}s alenia Space. N. J.-H. Roche, L. Dusseau, J. Boch, Y. Gonzalez Velo, J.-R. Vaill{\'e}, and F. Saign{\'e} are with the Universit{\'e} Montpellier II, IES—UMR CNRS 5214, F-34095 Montpellier cedex 5, France (e-mail: nicolas.roche@ies.univ-montp2. fr). G. Auriel and B. Azais are with the DGA, Direction de l{\textquoteright}Expertise Technique, Centre d{\textquoteright}Etudes de Gramat, F-46500 Gramat, France. S. P. Buchner is with the Global Strategies Group, Inc., Crofton, MD 21114 USA. R. Marec and P. Calvel are with the Thales Alenia Space, F-31037 Toulouse cedex 1, France. F. Bezerra is with the CNES, Centre National des Etudes Spatiales, F-31401 Toulouse cedex 9, France. Digital Object Identifier 10.1109/TNS.2010.2042616",
year = "2010",
month = aug,
doi = "10.1109/TNS.2010.2042616",
language = "English (US)",
volume = "57",
pages = "1861--1868",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "4 PART 1",
}