TY - GEN
T1 - Determination of complex permittivity for low- and high-loss materials at microwave frequencies
AU - Varadan, Siddharth K.
AU - Zhang, Lisha
AU - Pan, George
AU - Alford, Terry
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014
Y1 - 2014
N2 - We present the determination of the complex permittivity for low loss PCB material FR4 and high loss arsenic-doped silicon wafer in the GHz frequency range, based on closed-form analytical expressions employing the Bessel's functions. For convenience and economical reasons, the FR4 sample is cut from the commercial PCB as a sandwich disk of copper-dielectric-copper, while the bare silicon disk is contained in a prefabricated conducing cavity, referred to as the radial line cavity. Experimental measurements in support with the numerical analysis are also presented. Good agreement between computational results and laboratory measured data is observed.
AB - We present the determination of the complex permittivity for low loss PCB material FR4 and high loss arsenic-doped silicon wafer in the GHz frequency range, based on closed-form analytical expressions employing the Bessel's functions. For convenience and economical reasons, the FR4 sample is cut from the commercial PCB as a sandwich disk of copper-dielectric-copper, while the bare silicon disk is contained in a prefabricated conducing cavity, referred to as the radial line cavity. Experimental measurements in support with the numerical analysis are also presented. Good agreement between computational results and laboratory measured data is observed.
KW - Bessel's functions
KW - complex permittivity
KW - dielectric constant
KW - measurement
KW - microwave frequency
KW - printed circuit board (PCB)
KW - silicon wafer
UR - http://www.scopus.com/inward/record.url?scp=84937144972&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84937144972&partnerID=8YFLogxK
U2 - 10.1109/EPEPS.2014.7103638
DO - 10.1109/EPEPS.2014.7103638
M3 - Conference contribution
AN - SCOPUS:84937144972
T3 - 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
SP - 219
EP - 222
BT - 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
Y2 - 26 October 2014 through 29 October 2014
ER -