Abstract
The impact of impairments such as transmitter/receiver I/Q gain/phase mismatch on the performance have become severe due to high operational speeds and continuous technology scaling. In this paper, we present a built-in-self-test (BiST) solution for quadrature modulation transceiver circuits using only transmitter and receiver baseband signals for test analysis. The mapping between transmitter input signals and receiver output signals are used to extract impairment and nonlinearity parameters separately with the help of the NLS method and detailed nonlinear system modeling. Experimental measurement results are in good agreement with the simulations and they confirm the high accuracy of the proposed method.
Original language | English (US) |
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Article number | 5175281 |
Pages (from-to) | 901-911 |
Number of pages | 11 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 18 |
Issue number | 6 |
DOIs | |
State | Published - Jun 2010 |
Keywords
- Built-in-self-test (BiST)
- I/Q mismatch
- I/Q modulation
- Nonlinearity
- RF transceivers
- Time skew
ASJC Scopus subject areas
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering