Detailed characterization of transceiver parameters through loop-back-based BiST

Erdem S. Erdogan, Sule Ozev

Research output: Contribution to journalArticle

35 Citations (Scopus)

Abstract

The impact of impairments such as transmitter/receiver I/Q gain/phase mismatch on the performance have become severe due to high operational speeds and continuous technology scaling. In this paper, we present a built-in-self-test (BiST) solution for quadrature modulation transceiver circuits using only transmitter and receiver baseband signals for test analysis. The mapping between transmitter input signals and receiver output signals are used to extract impairment and nonlinearity parameters separately with the help of the NLS method and detailed nonlinear system modeling. Experimental measurement results are in good agreement with the simulations and they confirm the high accuracy of the proposed method.

Original languageEnglish (US)
Article number5175281
Pages (from-to)901-911
Number of pages11
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume18
Issue number6
DOIs
StatePublished - Jun 2010

Fingerprint

Built-in self test
Transceivers
Transmitters
Signal receivers
Nonlinear systems
Modulation
Networks (circuits)

Keywords

  • Built-in-self-test (BiST)
  • I/Q mismatch
  • I/Q modulation
  • Nonlinearity
  • RF transceivers
  • Time skew

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Software

Cite this

Detailed characterization of transceiver parameters through loop-back-based BiST. / Erdogan, Erdem S.; Ozev, Sule.

In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 18, No. 6, 5175281, 06.2010, p. 901-911.

Research output: Contribution to journalArticle

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