Design of an all-dielectric self-supporting cable system

Kumaraguru Prabakar, George G. Karady

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

All Dielectric Self-Supporting (ADSS) cables are installed along with transmission line for the purpose of communication. During installation the outer layer of the cable is hydrophobic and is not prone to dry band arcing. But, these cables becomes less hydrophobic over time and therefore vulnerable to dry band arcing. This loss in hydrophobicity occurs because of the contamination formed on the outer layer due to pollution. This is one of the reasons for cable failure. Considerable amount of losses will be incurred on the occurrence of a cable failure as these cables are leased to other companies. In this paper typical models are shown and their corresponding voltage distribution and current distribution are calculated. This could be used to predict dry band arcing on the models. The method used considers sag, span and pollution on the ADSS cable.

Original languageEnglish (US)
Title of host publication2010 International Conference on High Voltage Engineering and Application, ICHVE 2010
Pages184-187
Number of pages4
DOIs
StatePublished - Dec 31 2010
Event2010 International Conference on High Voltage Engineering and Application, ICHVE 2010 - New Orleans, LA, United States
Duration: Oct 11 2010Oct 14 2010

Publication series

Name2010 International Conference on High Voltage Engineering and Application, ICHVE 2010

Other

Other2010 International Conference on High Voltage Engineering and Application, ICHVE 2010
CountryUnited States
CityNew Orleans, LA
Period10/11/1010/14/10

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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  • Cite this

    Prabakar, K., & Karady, G. G. (2010). Design of an all-dielectric self-supporting cable system. In 2010 International Conference on High Voltage Engineering and Application, ICHVE 2010 (pp. 184-187). [5640833] (2010 International Conference on High Voltage Engineering and Application, ICHVE 2010). https://doi.org/10.1109/ICHVE.2010.5640833