Critical point mounting of kinetoplast DNA for atomic force microscopy

T. Thundat; R. J. Warmack; D. P. Allison; K. B. Jacobson; N. J. Tao; J. Vesenka; S. M. Lindsay; H. J.K. Horber; L. A. Bottomley; C. Rabke

Critical point mounting of kinetoplast DNA for atomic force microscopy

T. Thundat, R. J. Warmack, D. P. Allison, K. B. Jacobson, N. J. Tao, J. Vesenka, S. M. Lindsay, H. J.K. Horber, L. A. Bottomley, C. Rabke

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

Atomic force microscope (AFM) images of intact kinetoplast DNA were obtained from samples prepared utilizing critical point drying. These images are compared with AFM images obtained using conventional methods for DNA deposition. Although the images obtained on chemically pretreated mica show more details than on unmodified mica, images obtained with critical point drying were superior. Kinetoplast networks with expected sizes and structures were routinely observed with critical point drying. The resolution of individual strands of DNA was greatly improved, and image artifacts associated with air dried samples were eliminated. Samples prepared using mildly sonicated kinetoplast DNA show isolated minicircles.

Original language	English (US)
Pages (from-to)	23-30
Number of pages	8
Journal	Scanning Microscopy
Volume	8
Issue number	1
State	Published - Mar 1 1994
Externally published	Yes

Keywords

Atomic Force Microscopy
chemical treatment
critical point drying
kinetoplast DNA

ASJC Scopus subject areas

Instrumentation

Cite this

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title = "Critical point mounting of kinetoplast DNA for atomic force microscopy",

abstract = "Atomic force microscope (AFM) images of intact kinetoplast DNA were obtained from samples prepared utilizing critical point drying. These images are compared with AFM images obtained using conventional methods for DNA deposition. Although the images obtained on chemically pretreated mica show more details than on unmodified mica, images obtained with critical point drying were superior. Kinetoplast networks with expected sizes and structures were routinely observed with critical point drying. The resolution of individual strands of DNA was greatly improved, and image artifacts associated with air dried samples were eliminated. Samples prepared using mildly sonicated kinetoplast DNA show isolated minicircles.",

keywords = "Atomic Force Microscopy, chemical treatment, critical point drying, kinetoplast DNA",

author = "T. Thundat and Warmack, {R. J.} and Allison, {D. P.} and Jacobson, {K. B.} and Tao, {N. J.} and J. Vesenka and Lindsay, {S. M.} and Horber, {H. J.K.} and Bottomley, {L. A.} and C. Rabke",

year = "1994",

month = mar,

day = "1",

language = "English (US)",

volume = "8",

pages = "23--30",

journal = "Scanning Microscopy",

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TY - JOUR

T1 - Critical point mounting of kinetoplast DNA for atomic force microscopy

AU - Thundat, T.

AU - Warmack, R. J.

AU - Allison, D. P.

AU - Jacobson, K. B.

AU - Tao, N. J.

AU - Vesenka, J.

AU - Lindsay, S. M.

AU - Horber, H. J.K.

AU - Bottomley, L. A.

AU - Rabke, C.

PY - 1994/3/1

Y1 - 1994/3/1

N2 - Atomic force microscope (AFM) images of intact kinetoplast DNA were obtained from samples prepared utilizing critical point drying. These images are compared with AFM images obtained using conventional methods for DNA deposition. Although the images obtained on chemically pretreated mica show more details than on unmodified mica, images obtained with critical point drying were superior. Kinetoplast networks with expected sizes and structures were routinely observed with critical point drying. The resolution of individual strands of DNA was greatly improved, and image artifacts associated with air dried samples were eliminated. Samples prepared using mildly sonicated kinetoplast DNA show isolated minicircles.

AB - Atomic force microscope (AFM) images of intact kinetoplast DNA were obtained from samples prepared utilizing critical point drying. These images are compared with AFM images obtained using conventional methods for DNA deposition. Although the images obtained on chemically pretreated mica show more details than on unmodified mica, images obtained with critical point drying were superior. Kinetoplast networks with expected sizes and structures were routinely observed with critical point drying. The resolution of individual strands of DNA was greatly improved, and image artifacts associated with air dried samples were eliminated. Samples prepared using mildly sonicated kinetoplast DNA show isolated minicircles.

KW - Atomic Force Microscopy

KW - chemical treatment

KW - critical point drying

KW - kinetoplast DNA

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M3 - Article

AN - SCOPUS:0028385255

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Critical point mounting of kinetoplast DNA for atomic force microscopy

Abstract

Keywords

ASJC Scopus subject areas

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