Critical point mounting of kinetoplast DNA for atomic force microscopy

T. Thundat, R. J. Warmack, D. P. Allison, K. B. Jacobson, Nongjian Tao, J. Vesenka, Stuart Lindsay, H. J K Horber, L. A. Bottomley, C. Rabke

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

Atomic force microscope (AFM) images of intact kinetoplast DNA were obtained from samples prepared utilizing critical point drying. These images are compared with AFM images obtained using conventional methods for DNA deposition. Although the images obtained on chemically pretreated mica show more details than on unmodified mica, images obtained with critical point drying were superior. Kinetoplast networks with expected sizes and structures were routinely observed with critical point drying. The resolution of individual strands of DNA was greatly improved, and image artifacts associated with air dried samples were eliminated. Samples prepared using mildly sonicated kinetoplast DNA show isolated minicircles.

Original languageEnglish (US)
Pages (from-to)23-30
Number of pages8
JournalScanning Microscopy
Volume8
Issue number1
StatePublished - Mar 1994
Externally publishedYes

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mounting
Mountings
Atomic force microscopy
critical point
DNA
deoxyribonucleic acid
atomic force microscopy
Drying
Mica
drying
Microscopes
mica
microscopes
strands
artifacts
Air
air

Keywords

  • Atomic Force Microscopy
  • chemical treatment
  • critical point drying
  • kinetoplast DNA

ASJC Scopus subject areas

  • Instrumentation

Cite this

Thundat, T., Warmack, R. J., Allison, D. P., Jacobson, K. B., Tao, N., Vesenka, J., ... Rabke, C. (1994). Critical point mounting of kinetoplast DNA for atomic force microscopy. Scanning Microscopy, 8(1), 23-30.

Critical point mounting of kinetoplast DNA for atomic force microscopy. / Thundat, T.; Warmack, R. J.; Allison, D. P.; Jacobson, K. B.; Tao, Nongjian; Vesenka, J.; Lindsay, Stuart; Horber, H. J K; Bottomley, L. A.; Rabke, C.

In: Scanning Microscopy, Vol. 8, No. 1, 03.1994, p. 23-30.

Research output: Contribution to journalArticle

Thundat, T, Warmack, RJ, Allison, DP, Jacobson, KB, Tao, N, Vesenka, J, Lindsay, S, Horber, HJK, Bottomley, LA & Rabke, C 1994, 'Critical point mounting of kinetoplast DNA for atomic force microscopy', Scanning Microscopy, vol. 8, no. 1, pp. 23-30.
Thundat T, Warmack RJ, Allison DP, Jacobson KB, Tao N, Vesenka J et al. Critical point mounting of kinetoplast DNA for atomic force microscopy. Scanning Microscopy. 1994 Mar;8(1):23-30.
Thundat, T. ; Warmack, R. J. ; Allison, D. P. ; Jacobson, K. B. ; Tao, Nongjian ; Vesenka, J. ; Lindsay, Stuart ; Horber, H. J K ; Bottomley, L. A. ; Rabke, C. / Critical point mounting of kinetoplast DNA for atomic force microscopy. In: Scanning Microscopy. 1994 ; Vol. 8, No. 1. pp. 23-30.
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