Conditions for direct structure imaging in silicon carbide polytypes.

David Smith, M. A. O'Keefe

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

Direct structure imaging in the high-resolution EM of stacking sequences in SiC polytypes requires a resolution of better than 2.5 A. Polytype stacking sequences should in principle be recognizable but only under restricted imaging conditions (degree of defocus) and for crystals <approx 75 A thick. -J.E.C.

Original languageEnglish (US)
Pages (from-to)139-148
Number of pages10
JournalActa Crystallographica
VolumeA39
Issue numberPart 1
StatePublished - 1983
Externally publishedYes

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stacking
silicon
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ASJC Scopus subject areas

  • Environmental Science(all)
  • Earth and Planetary Sciences(all)

Cite this

Conditions for direct structure imaging in silicon carbide polytypes. / Smith, David; O'Keefe, M. A.

In: Acta Crystallographica, Vol. A39, No. Part 1, 1983, p. 139-148.

Research output: Contribution to journalArticle

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