@inproceedings{2858e579fa5341a1b7d7ec5db69b66d5,
title = "Characterization of encapsulated solar cells by x-ray topography",
abstract = "Solar panel's reliability studies focus mainly on the properties of the encapsulating such as gel content and transmittance, while ignoring the impact of encapsulation process on the solar cells themselves. The harsh lamination conditions apply high temperature and pressure on the wafers, which can induce increased stress, deformation and defects. The investigation of solar cells sealed inside modules calls for a non-destructive method. In this paper, we demonstrate that transmission X-ray topography (XRT) can be used as an accurate method to evaluate bending feature of encapsulated wafers and present in detail the experimental methods from capturing diffraction data to the data analysis.",
keywords = "Diffraction, Lamination, Reliability, Silicon, Solar cell, X-ray topography",
author = "Xiaodong Meng and Michael Stuckelberger and Laura Ding and Bradley West and April Jeffries and Mariana Bertoni",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 ; Conference date: 05-06-2016 Through 10-06-2016",
year = "2016",
month = nov,
day = "18",
doi = "10.1109/PVSC.2016.7749559",
language = "English (US)",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "111--114",
booktitle = "2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016",
}