TY - JOUR
T1 - Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers
AU - Jeong, Jae Woong
AU - Nassery, Afsaneh
AU - Kitchen, Jennifer
AU - Ozev, Sule
N1 - Funding Information:
This work was supported in part by the National Science Foundation and in part by Semiconductor Research Corporation.
Publisher Copyright:
© 2016 IEEE.
PY - 2016/6
Y1 - 2016/6
N2 - We propose a self-test method for zero-IF radio frequency transceivers using primarily loopback, aided by a small built-in self-test (BIST) circuitry, to determine critical performance parameters, such as I/Q imbalance and nonlinearity coefficients. The transceiver is placed in the loopback mode by couplers, specifically designed to be asymmetric with respect to the primary path and the BIST path. The loopback path is also designed to include two traces with slightly different delays to enable parameter deembedding. Transceiver parameters are analytically computed using baseband I and Q signals over two frames, each of which is 200 μs in duration. Overall, measurement time is <10 ms, including computation time. In addition to loopback hardware support and the associated parameter deembedding methodology, we propose a complimentary BIST circuit to measure the transmitter (TX) gain. The measured parameters can be used for predistortion or postdistortion to calibrate the transceiver, both at production time and in the field. Both simulation and hardware measurement results show that the proposed method can determine the target performance parameters with adequate accuracy for digital calibration. Measurement and the subsequent calibration are shown to reduce TX error vector magnitude more than fivefold, even for significantly impaired systems.
AB - We propose a self-test method for zero-IF radio frequency transceivers using primarily loopback, aided by a small built-in self-test (BIST) circuitry, to determine critical performance parameters, such as I/Q imbalance and nonlinearity coefficients. The transceiver is placed in the loopback mode by couplers, specifically designed to be asymmetric with respect to the primary path and the BIST path. The loopback path is also designed to include two traces with slightly different delays to enable parameter deembedding. Transceiver parameters are analytically computed using baseband I and Q signals over two frames, each of which is 200 μs in duration. Overall, measurement time is <10 ms, including computation time. In addition to loopback hardware support and the associated parameter deembedding methodology, we propose a complimentary BIST circuit to measure the transmitter (TX) gain. The measured parameters can be used for predistortion or postdistortion to calibrate the transceiver, both at production time and in the field. Both simulation and hardware measurement results show that the proposed method can determine the target performance parameters with adequate accuracy for digital calibration. Measurement and the subsequent calibration are shown to reduce TX error vector magnitude more than fivefold, even for significantly impaired systems.
KW - Built-in self-test (BIST)
KW - calibration
KW - loopback test
KW - radio frequency (RF) transceiver.
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U2 - 10.1109/TVLSI.2015.2506547
DO - 10.1109/TVLSI.2015.2506547
M3 - Article
AN - SCOPUS:84953269130
SN - 1063-8210
VL - 24
SP - 2286
EP - 2298
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IS - 6
M1 - 7373678
ER -