Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers

Jae Woong Jeong, Afsaneh Nassery, Jennifer Kitchen, Sule Ozev

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

We propose a self-test method for zero-IF radio frequency transceivers using primarily loopback, aided by a small built-in self-test (BIST) circuitry, to determine critical performance parameters, such as I/Q imbalance and nonlinearity coefficients. The transceiver is placed in the loopback mode by couplers, specifically designed to be asymmetric with respect to the primary path and the BIST path. The loopback path is also designed to include two traces with slightly different delays to enable parameter deembedding. Transceiver parameters are analytically computed using baseband I and Q signals over two frames, each of which is 200 μs in duration. Overall, measurement time is

Original languageEnglish (US)
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOIs
StateAccepted/In press - Jan 6 2016

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Built-in self test
Transceivers
Calibration
Time measurement

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Software

Cite this

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