Abstract

We report on a study of atomic-sized metallic contacts on a time scale of nanoseconds using a combined DC and AC circuit. The approach leads to a time resolution 3-4 orders of magnitude faster than the measurements carried out to date, making it possible to observe fast transient conductance-switching events associated with the breakdown, re-formation, and atomic scale structural rearrangements of the contact. The study bridges the wide gap in the time scales between the molecular dynamic simulations and real world experiments, and the method may be applied to study nano- and subnanosecond processes in other nanoscale devices, such as molecular junctions.

Original languageEnglish (US)
Pages (from-to)927-933
Number of pages7
JournalNano Letters
Volume11
Issue number3
DOIs
StatePublished - Mar 9 2011

Fingerprint

Molecular dynamics
breakdown
Networks (circuits)
Computer simulation
Experiments
alternating current
direct current
molecular dynamics
simulation

Keywords

  • atomic size contact
  • conductance quantization
  • electron transport
  • molecular junctions
  • Quantum point contact
  • RF STM

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanical Engineering

Cite this

Breakdown of atomic-sized metallic contacts measured on nanosecond scale. / Guo, Shaoyin; Hihath, Joshua; Tao, Nongjian.

In: Nano Letters, Vol. 11, No. 3, 09.03.2011, p. 927-933.

Research output: Contribution to journalArticle

Guo, Shaoyin ; Hihath, Joshua ; Tao, Nongjian. / Breakdown of atomic-sized metallic contacts measured on nanosecond scale. In: Nano Letters. 2011 ; Vol. 11, No. 3. pp. 927-933.
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