ATOMIC NUMBER IMAGING OF SUPPORTED CATALYST PARTICLES BY SCANNING TRANSMISSION ELECTRON MICROSCOPE.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The capabilities of the conventional and scanning transmission electron microscopes (CTEM and STEM, respectively) as tools for studying supported catalysts are briefly compared. The advantages of Z contrast, or the atomic number imaging technique, in the STEM over conventional imaging technique employed in the CTEM are emphasized. It is shown that Z contrast is capable of detecting small clusters of heavy atoms such as Pt down to single atoms in size when supported on low atomic number supports such as charcoal or gamma -Al//2O//3. The technique, however, is not reliable as a method for unambiguously identifying the chemical nature of such small clusters.

Original languageEnglish (US)
Title of host publicationACS Symposium Series
PublisherACS
Pages367-383
Number of pages17
ISBN (Print)084120831X, 9780841208315
DOIs
StatePublished - 1984
Externally publishedYes

Publication series

NameACS Symposium Series
ISSN (Print)0097-6156

ASJC Scopus subject areas

  • Chemistry(all)
  • Chemical Engineering(all)

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