Atomic force and scanning tunneling microscopy observations of whisker crystals and surface modification on evaporated gold films

P. I. Oden, L. A. Nagahara, J. J. Graham, Jin Pan, Nongjian Tao, Yinquan Li, T. G. Thundat, J. A. DeRose, Stuart Lindsay

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

We present atomic force microscope (AFM) images of whisker crystals interacting with the AFM probe tips for whiskers grown out of the surface of epitaxially made Au(111) on mica substrates. AFM images of broken-off whiskers lying on these gold substrates are presented as well. AFM and scanning tunneling microscopy (STM) have also been used to observe (and create, in the case of the STM) stress-induced steps on the gold-on-mica surface. We have also observed these stress-induced steps (with AFM) after applying an external stress to the gold-on-mica substrate.

Original languageEnglish (US)
Pages (from-to)580-586
Number of pages7
JournalUltramicroscopy
Volume42-44
Issue numberPART 1
DOIs
StatePublished - Jul 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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