Abstract
We present atomic force microscope (AFM) images of whisker crystals interacting with the AFM probe tips for whiskers grown out of the surface of epitaxially made Au(111) on mica substrates. AFM images of broken-off whiskers lying on these gold substrates are presented as well. AFM and scanning tunneling microscopy (STM) have also been used to observe (and create, in the case of the STM) stress-induced steps on the gold-on-mica surface. We have also observed these stress-induced steps (with AFM) after applying an external stress to the gold-on-mica substrate.
Original language | English (US) |
---|---|
Pages (from-to) | 580-586 |
Number of pages | 7 |
Journal | Ultramicroscopy |
Volume | 42-44 |
Issue number | PART 1 |
DOIs | |
State | Published - Jul 1992 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation