3 Scopus citations

Abstract

Potential induced degradation (PID) has recently been recognized by the industry as a critical PV module durability issue. Many methods to prevent PID have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a potential method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin and flexible Corning Willow™ glass sheets or strips on the glass superstrates of PV modules, disrupting the current leakage path from the cells to the grounded frame.

Original languageEnglish (US)
Title of host publication2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479979448
DOIs
StatePublished - Dec 14 2015
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: Jun 14 2015Jun 19 2015

Other

Other42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
CountryUnited States
CityNew Orleans
Period6/14/156/19/15

Keywords

  • durability
  • photovoltaic cells
  • PID
  • reliability
  • shunting

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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