Application of flexible glass to prevent PID in PV modules

Jaewon Oh; Govindasamy Tamizhmani; Stuart Bowden; Sean Garner

doi:10.1109/PVSC.2015.7355701

Application of flexible glass to prevent PID in PV modules

Jaewon Oh, Govindasamy Tamizhmani, Stuart Bowden, Sean Garner

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

Potential induced degradation (PID) has recently been recognized by the industry as a critical PV module durability issue. Many methods to prevent PID have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a potential method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin and flexible Corning Willow™ glass sheets or strips on the glass superstrates of PV modules, disrupting the current leakage path from the cells to the grounded frame.

Original language	English (US)
Title of host publication	2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781479979448
DOIs	https://doi.org/10.1109/PVSC.2015.7355701
State	Published - Dec 14 2015
Event	42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States Duration: Jun 14 2015 → Jun 19 2015

Other

Other	42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
Country/Territory	United States
City	New Orleans
Period	6/14/15 → 6/19/15

Keywords

durability
photovoltaic cells
PID
reliability
shunting

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/PVSC.2015.7355701

Cite this

Oh, J, Tamizhmani, G, Bowden, S & Garner, S 2015, Application of flexible glass to prevent PID in PV modules. in 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015., 7355701, Institute of Electrical and Electronics Engineers Inc., 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015, New Orleans, United States, 6/14/15. https://doi.org/10.1109/PVSC.2015.7355701

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title = "Application of flexible glass to prevent PID in PV modules",

abstract = "Potential induced degradation (PID) has recently been recognized by the industry as a critical PV module durability issue. Many methods to prevent PID have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a potential method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin and flexible Corning Willow{\texttrademark} glass sheets or strips on the glass superstrates of PV modules, disrupting the current leakage path from the cells to the grounded frame.",

keywords = "durability, photovoltaic cells, PID, reliability, shunting",

author = "Jaewon Oh and Govindasamy Tamizhmani and Stuart Bowden and Sean Garner",

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doi = "10.1109/PVSC.2015.7355701",

language = "English (US)",

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booktitle = "2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015",

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note = "42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 ; Conference date: 14-06-2015 Through 19-06-2015",

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AU - Oh, Jaewon

AU - Tamizhmani, Govindasamy

AU - Bowden, Stuart

AU - Garner, Sean

PY - 2015/12/14

Y1 - 2015/12/14

N2 - Potential induced degradation (PID) has recently been recognized by the industry as a critical PV module durability issue. Many methods to prevent PID have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a potential method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin and flexible Corning Willow™ glass sheets or strips on the glass superstrates of PV modules, disrupting the current leakage path from the cells to the grounded frame.

AB - Potential induced degradation (PID) has recently been recognized by the industry as a critical PV module durability issue. Many methods to prevent PID have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a potential method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin and flexible Corning Willow™ glass sheets or strips on the glass superstrates of PV modules, disrupting the current leakage path from the cells to the grounded frame.

KW - durability

KW - photovoltaic cells

KW - PID

KW - reliability

KW - shunting

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U2 - 10.1109/PVSC.2015.7355701

DO - 10.1109/PVSC.2015.7355701

M3 - Conference contribution

AN - SCOPUS:84961642733

SN - 9781479979448

BT - 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015

Y2 - 14 June 2015 through 19 June 2015

ER -

Application of flexible glass to prevent PID in PV modules

Abstract

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Keywords

ASJC Scopus subject areas

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