An experimental technique to measure the shunt resistance across a local region of a floating junction

Keith R. McIntosh, Ganokwan Boonprakaikaew, Christiana B. Honsberg

Research output: Contribution to journalArticle

Abstract

The inclusion of a floating junction (FJ) at the surface of a solar cell is one way to obtain good-quality surface passivation. The development of FJ-passivated solar cells, however, has been hindered by the frequent occurrence of shunting across the FJ. Shunting can occur at specific regions of the FJ, such as at isolated points of the base contact or at the edges of the solar cell. This paper presents an experimental technique to determine the shunt resistance across local regions of an FJ, thereby providing a means to compare the prevalence of shunting in one region to another. By locating and quantifying the shunting in specific regions of an FJ, valuable insight into its cause can be obtained.

Original languageEnglish (US)
Pages (from-to)353-361
Number of pages9
JournalSolar Energy Materials and Solar Cells
Volume64
Issue number4
DOIs
StatePublished - Nov 2000
Externally publishedYes

Keywords

  • Characterisation
  • Floating-junction passivation
  • Shunt resistance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Renewable Energy, Sustainability and the Environment
  • Surfaces, Coatings and Films

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