An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayre, D. A. Shapiro, John Spence, D. Starodub

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