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An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy
M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayre, D. A. Shapiro, John Spence, D. Starodub
Research output: Contribution to journal › Article › peer-review
387
Scopus
citations