Advanced transmission electron microscopy

Imaging and diffraction in nanoscience

Jian Min Zuo, John Spence

Research output: Book/ReportBook

15 Citations (Scopus)

Abstract

This volume expands and updates the coverage in the authors’ popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors’ extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Original languageEnglish (US)
PublisherSpringer New York
Number of pages729
ISBN (Electronic)9781493966073
ISBN (Print)9781493966059
DOIs
StatePublished - Jan 1 2016

Fingerprint

Nanoscience
Transmission Electron Microscopy
Diffraction
Electrons
Transmission electron microscopy
Imaging techniques
Electron diffraction
transmission electron microscopy
electron diffraction
diffraction
Electron scattering
Crystal defects
Multiple scattering
Materials science
materials science
Aberrations
crystal defects
aberration
Nanostructures
Teaching

ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)
  • Physics and Astronomy(all)
  • Biochemistry, Genetics and Molecular Biology(all)

Cite this

Advanced transmission electron microscopy : Imaging and diffraction in nanoscience. / Zuo, Jian Min; Spence, John.

Springer New York, 2016. 729 p.

Research output: Book/ReportBook

@book{475a18354f1a42ac9b387201a72b51eb,
title = "Advanced transmission electron microscopy: Imaging and diffraction in nanoscience",
abstract = "This volume expands and updates the coverage in the authors’ popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors’ extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.",
author = "Zuo, {Jian Min} and John Spence",
year = "2016",
month = "1",
day = "1",
doi = "10.1007/978-1-4939-6607-3",
language = "English (US)",
isbn = "9781493966059",
publisher = "Springer New York",
address = "United States",

}

TY - BOOK

T1 - Advanced transmission electron microscopy

T2 - Imaging and diffraction in nanoscience

AU - Zuo, Jian Min

AU - Spence, John

PY - 2016/1/1

Y1 - 2016/1/1

N2 - This volume expands and updates the coverage in the authors’ popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors’ extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

AB - This volume expands and updates the coverage in the authors’ popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors’ extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

UR - http://www.scopus.com/inward/record.url?scp=85018910562&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85018910562&partnerID=8YFLogxK

U2 - 10.1007/978-1-4939-6607-3

DO - 10.1007/978-1-4939-6607-3

M3 - Book

SN - 9781493966059

BT - Advanced transmission electron microscopy

PB - Springer New York

ER -