Adaptive testing of chips with varying distributions of unknown response bits

Chandra K H Suresh; Ozgur Sinanoglu; Sule Ozev

doi:10.1109/ETS.2012.6233023

Adaptive testing of chips with varying distributions of unknown response bits

Chandra K H Suresh, Ozgur Sinanoglu, Sule Ozev

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

Traditionally, test patterns that are generated for a given circuit are applied in an identical manner to all manufactured devices. With increasing process variations, the statistical diversity of manufactured devices is increasing, making such one-size-fits-all approaches increasingly inefficient, and resulting in yield and quality loss. Adaptive test techniques address this problem by tailoring the test decisions for the statistical characteristics of the device under test. In this paper, we present several adaptive strategies to enable adaptive unknown bit masking so as to ensure no yield loss while attaining the maximum test quality based on tester memory constraints.

Original language	English (US)
Title of host publication	Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012
DOIs	https://doi.org/10.1109/ETS.2012.6233023
State	Published - Aug 13 2012
Event	2012 17th IEEE European Test Symposium, ETS 2012 - Annecy, France Duration: May 28 2012 → Jun 1 2012

Publication series

Name	Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012

Other

Other	2012 17th IEEE European Test Symposium, ETS 2012
Country/Territory	France
City	Annecy
Period	5/28/12 → 6/1/12

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/ETS.2012.6233023

Cite this

Suresh, CKH, Sinanoglu, O & Ozev, S 2012, Adaptive testing of chips with varying distributions of unknown response bits. in Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012., 6233023, Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012, 2012 17th IEEE European Test Symposium, ETS 2012, Annecy, France, 5/28/12. https://doi.org/10.1109/ETS.2012.6233023

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author = "Suresh, {Chandra K H} and Ozgur Sinanoglu and Sule Ozev",

year = "2012",

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M3 - Conference contribution

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Adaptive testing of chips with varying distributions of unknown response bits

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