Abstract

Noise and interference in sensor measurements degrade the quality of data and have a negative impact on the performance of structural damage diagnosis systems. In this paper, a novel adaptive measurement screening approach is presented to automatically select the most informative measurements and use them intelligently for structural damage estimation. The method is implemented efficiently in a sequential Monte Carlo (SMC) setting using particle filtering. The noise suppression and improved damage estimation capability of the proposed method is demonstrated by an application to the problem of estimating progressive fatigue damage in an aluminum compact-tension (CT) sample using noisy PZT sensor measurements.

Original languageEnglish (US)
Title of host publicationSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2011
DOIs
StatePublished - May 26 2011
EventSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2011 - San Diego, CA, United States
Duration: Mar 7 2011Mar 10 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7981
ISSN (Print)0277-786X

Other

OtherSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2011
CountryUnited States
CitySan Diego, CA
Period3/7/113/10/11

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Keywords

  • adaptive measurement selection
  • noise suppression
  • progressive damage diagnosis
  • sequential Monte Carlo
  • structural health monitoring

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Zhou, W., Kovvali, N., Papandreou-Suppappola, A., Chattopadhyay, A., & Peralta, P. (2011). Adaptive measurement selection for progressive damage estimation. In Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2011 [798127] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7981). https://doi.org/10.1117/12.882029