@inproceedings{2e3b609fd896460faa7c24114e19a76e,
title = "Adaptive accelerated aging with 28nm HKMG technology",
abstract = "Device and circuit reliability analysis lacks a direct validation of the lifetime. Usually, aging in devices is extrapolated from a short-Term measurement, resulting in unreliable prediction of the end of lifetime (EOL). This work aims at providing a new approach to test the device to the end of lifetime in a fast and controllable manner. The contributions of this work include: (1) Introducing a test methodology called Adaptive Accelerated Aging (AAA), (2) Providing test conditions for multiple stress conditions, including those for achieving EOL in 1 hour, and (3) Presenting simulation and test results at 28nm to validate the proposed methodology.",
keywords = "Accelerated Aging, Aging, EOL, HCI, NBTI, PBTI, TDDB",
author = "Devyani Patra and Reza, {Ahmed Kamal} and Hassan, {Mohammed Khaled} and Mehdi Katoozi and Cannon, {Ethan H.} and Kaushik Roy and Yu Cao",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 International Reliability Physics Symposium, IRPS 2017 ; Conference date: 02-04-2017 Through 06-04-2017",
year = "2017",
month = may,
day = "30",
doi = "10.1109/IRPS.2017.7936351",
language = "English (US)",
series = "IEEE International Reliability Physics Symposium Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "CR2.1--CR2.4",
booktitle = "2017 International Reliability Physics Symposium, IRPS 2017",
}