ACE: A robust variability and aging sensor for high-k/metal gate SoC

Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A novel on-chip variability and aging sensor has been designed for robust generation of a voltage guard band in high-K/metal gate technologies. It is the first single sensor solution that is capable of guard-banding for both NBTI and PBTI effects. It offers the SoC the capability to dynamically adjust the on-chip guard-band for joint power-reliability optimization.

Original languageEnglish (US)
Title of host publicationEuropean Solid-State Device Research Conference
PublisherIEEE Computer Society
Pages182-185
Number of pages4
ISBN (Print)9781479906499
DOIs
StatePublished - 2013
Event43rd European Solid-State Device Research Conference, ESSDERC 2013 - Bucharest
Duration: Sep 16 2013Sep 20 2013

Other

Other43rd European Solid-State Device Research Conference, ESSDERC 2013
CityBucharest
Period9/16/139/20/13

Fingerprint

Aging of materials
Sensors
Metals
Electric potential
System-on-chip
Negative bias temperature instability

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Chen, M., Reddy, V., Krishnan, S., Ondrusek, J., & Cao, Y. (2013). ACE: A robust variability and aging sensor for high-k/metal gate SoC. In European Solid-State Device Research Conference (pp. 182-185). [6818849] IEEE Computer Society. https://doi.org/10.1109/ESSDERC.2013.6818849

ACE : A robust variability and aging sensor for high-k/metal gate SoC. / Chen, Min; Reddy, Vijay; Krishnan, Srikanth; Ondrusek, Jay; Cao, Yu.

European Solid-State Device Research Conference. IEEE Computer Society, 2013. p. 182-185 6818849.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chen, M, Reddy, V, Krishnan, S, Ondrusek, J & Cao, Y 2013, ACE: A robust variability and aging sensor for high-k/metal gate SoC. in European Solid-State Device Research Conference., 6818849, IEEE Computer Society, pp. 182-185, 43rd European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, 9/16/13. https://doi.org/10.1109/ESSDERC.2013.6818849
Chen M, Reddy V, Krishnan S, Ondrusek J, Cao Y. ACE: A robust variability and aging sensor for high-k/metal gate SoC. In European Solid-State Device Research Conference. IEEE Computer Society. 2013. p. 182-185. 6818849 https://doi.org/10.1109/ESSDERC.2013.6818849
Chen, Min ; Reddy, Vijay ; Krishnan, Srikanth ; Ondrusek, Jay ; Cao, Yu. / ACE : A robust variability and aging sensor for high-k/metal gate SoC. European Solid-State Device Research Conference. IEEE Computer Society, 2013. pp. 182-185
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