ACE: A robust variability and aging sensor for high-k/metal gate SoC

Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A novel on-chip variability and aging sensor has been designed for robust generation of a voltage guard band in high-K/metal gate technologies. It is the first single sensor solution that is capable of guard-banding for both NBTI and PBTI effects. It offers the SoC the capability to dynamically adjust the on-chip guard-band for joint power-reliability optimization.

Original languageEnglish (US)
Title of host publicationESSDERC 2013 - Proceedings of the 43rd European Solid-State Device Research Conference
PublisherIEEE Computer Society
Pages182-185
Number of pages4
ISBN (Print)9781479906499
DOIs
StatePublished - Jan 1 2013
Event43rd European Solid-State Device Research Conference, ESSDERC 2013 - Bucharest, Romania
Duration: Sep 16 2013Sep 20 2013

Publication series

NameEuropean Solid-State Device Research Conference
ISSN (Print)1930-8876

Conference

Conference43rd European Solid-State Device Research Conference, ESSDERC 2013
CountryRomania
CityBucharest
Period9/16/139/20/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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    Chen, M., Reddy, V., Krishnan, S., Ondrusek, J., & Cao, Y. (2013). ACE: A robust variability and aging sensor for high-k/metal gate SoC. In ESSDERC 2013 - Proceedings of the 43rd European Solid-State Device Research Conference (pp. 182-185). [6818849] (European Solid-State Device Research Conference). IEEE Computer Society. https://doi.org/10.1109/ESSDERC.2013.6818849