Abstract
A method to quantitatively determine the fluences of shallowly-implanted solar wind ions returned to Earth by the Genesis Discovery mission is described. Through backside depth-profiling, we recover nearly complete depth profiles of implanted solar wind for several nonvolatile elements, including Mg, Al, Ca, Cr, and, to a lesser extent, Na, in silicon targets that collected bulk solar wind and solar wind from specific velocity regimes. We also determine the fluences of the volatile elements C, N, and O in silicon targets that collected bulk solar wind. By the use of appropriately calibrated ion implanted standards, fluences as low as 2×1010 atoms cm-2 can be determined with precision and accuracy typically in the few percent range. Specific approaches to sample preparation, sputtering artifacts during depth profiling by secondary ion mass spectrometry, and quantification including the production of ion implant standards are discussed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 61-73 |
| Number of pages | 13 |
| Journal | Chemical Geology |
| Volume | 390 |
| DOIs | |
| State | Published - Dec 8 2014 |
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Keywords
- Backside depth profiling
- Genesis mission
- Ion implantation
- Secondary ion mass spectrometry
- Solar wind analysis
ASJC Scopus subject areas
- Geology
- Geochemistry and Petrology
Cite this
Accurate analysis of shallowly implanted solar wind ions by SIMS backside depth profiling. / Heber, Veronika S.; McKeegan, Kevin D.; Burnett, Donald S.; Duprat, Jean; Guan, Yunbin; Jurewicz, Amy; Olinger, Chad T.; Smith, Stephen P.
In: Chemical Geology, Vol. 390, 08.12.2014, p. 61-73.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Accurate analysis of shallowly implanted solar wind ions by SIMS backside depth profiling
AU - Heber, Veronika S.
AU - McKeegan, Kevin D.
AU - Burnett, Donald S.
AU - Duprat, Jean
AU - Guan, Yunbin
AU - Jurewicz, Amy
AU - Olinger, Chad T.
AU - Smith, Stephen P.
PY - 2014/12/8
Y1 - 2014/12/8
N2 - A method to quantitatively determine the fluences of shallowly-implanted solar wind ions returned to Earth by the Genesis Discovery mission is described. Through backside depth-profiling, we recover nearly complete depth profiles of implanted solar wind for several nonvolatile elements, including Mg, Al, Ca, Cr, and, to a lesser extent, Na, in silicon targets that collected bulk solar wind and solar wind from specific velocity regimes. We also determine the fluences of the volatile elements C, N, and O in silicon targets that collected bulk solar wind. By the use of appropriately calibrated ion implanted standards, fluences as low as 2×1010 atoms cm-2 can be determined with precision and accuracy typically in the few percent range. Specific approaches to sample preparation, sputtering artifacts during depth profiling by secondary ion mass spectrometry, and quantification including the production of ion implant standards are discussed.
AB - A method to quantitatively determine the fluences of shallowly-implanted solar wind ions returned to Earth by the Genesis Discovery mission is described. Through backside depth-profiling, we recover nearly complete depth profiles of implanted solar wind for several nonvolatile elements, including Mg, Al, Ca, Cr, and, to a lesser extent, Na, in silicon targets that collected bulk solar wind and solar wind from specific velocity regimes. We also determine the fluences of the volatile elements C, N, and O in silicon targets that collected bulk solar wind. By the use of appropriately calibrated ion implanted standards, fluences as low as 2×1010 atoms cm-2 can be determined with precision and accuracy typically in the few percent range. Specific approaches to sample preparation, sputtering artifacts during depth profiling by secondary ion mass spectrometry, and quantification including the production of ion implant standards are discussed.
KW - Backside depth profiling
KW - Genesis mission
KW - Ion implantation
KW - Secondary ion mass spectrometry
KW - Solar wind analysis
UR - http://www.scopus.com/inward/record.url?scp=84910035106&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84910035106&partnerID=8YFLogxK
U2 - 10.1016/j.chemgeo.2014.10.003
DO - 10.1016/j.chemgeo.2014.10.003
M3 - Article
AN - SCOPUS:84910035106
VL - 390
SP - 61
EP - 73
JO - Chemical Geology
JF - Chemical Geology
SN - 0009-2541
ER -