Ab initio study of the valence-electron relaxation effect on x-ray-emission spectra and the excitonic effect on electron-energy-loss spectra of the Si L2,3 edge

H. Ma, S. H. Lin, Ray Carpenter, O. F. Sankey

9 Scopus citations

Abstract

The valence-band-electron relaxation effect on x-ray-emission spectra and the excitonic effect on electron-energy-loss spectra of the Si L2,3 edge were studied using an ab initio self-consistent pseudo-atomic-orbital method with large unit cells. Comparisons of our theoretical results with experimental x-ray-emission and electron-energy-loss spectra of the Si L2,3 edge suggest that there is very little relaxation of valence-band electrons before the 2p core hole is filled by one of the valence electrons. When including the excitonic effect in electron-energy-loss near-edge-structure calculations, the valence band should therefore be kept the same as the ground state.

Original languageEnglish (US)
Pages (from-to)13393-13397
Number of pages5
JournalPhysical Review B
Volume44
Issue number24
DOIs
Publication statusPublished - 1991

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ASJC Scopus subject areas

  • Condensed Matter Physics

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