A Terahertz Microscopy Technique for Sweat Duct Detection

Panagiotis C. Theofanopoulos, Georgios Trichopoulos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We propose a THz imaging technique that uses high reflective index optics to improve spatial resolution and enable a novel biometrics imaging tool. Specifically, with the use of THz waves we can penetrate the drier outer skin layers and provide anatomical information on the skin's layered morphology and the underlying structures (e.g. sweat ducts). Sweat ducts are subcutaneous helical structures that exhibit absorption in the sub-THz frequency range. The proposed THz microscopy configuration can acquire high spatial resolution images of the human skin and classify sweat ducts based on the backscattered THz spectrum. In this paper, the theoretical background of the microscopy technique and the experimental design are discussed. Finally, THz images of human fingerprints are presented, verifying the imaging capabilities of the proposed configuration.

Original languageEnglish (US)
Title of host publicationProceedings of the 2018 IEEE/MTT-S International Microwave Symposium, IMS 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages864-867
Number of pages4
Volume2018-June
ISBN (Print)9781538650677
DOIs
StatePublished - Aug 17 2018
Event2018 IEEE/MTT-S International Microwave Symposium, IMS 2018 - Philadelphia, United States
Duration: Jun 10 2018Jun 15 2018

Other

Other2018 IEEE/MTT-S International Microwave Symposium, IMS 2018
CountryUnited States
CityPhiladelphia
Period6/10/186/15/18

Keywords

  • microscopy
  • sweat ducts
  • Terahertz

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Theofanopoulos, P. C., & Trichopoulos, G. (2018). A Terahertz Microscopy Technique for Sweat Duct Detection. In Proceedings of the 2018 IEEE/MTT-S International Microwave Symposium, IMS 2018 (Vol. 2018-June, pp. 864-867). [8439158] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSYM.2018.8439158