A review of the lumped element kinetic inductance detector

Simon Doyle, Philip Mauskopf, Jin Zhang, Alessandro Monfardini, Loren Swenson, Jochem J.A. Baselmans, Stephen J.C. Yates, Markus Roesch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations

Abstract

The Lumped Element Kinetic Inductance Detector (LEKID) was first proposed in 2007 as a solution for using kinetic inductance type detectors for sub-mm astronomy (450 - 200μm). Since then the LEKID has been demonstrated to have applications over a much wider range of wavelength. Examples of this have been 200μm detection of a cold blackbody and successful testing of a demonstration array operating at 2mm on the IRAM telescope in October 2009. Due to the combination of absorber and detector in a single element, the LEKID is an extremely simple detector to fabricate requiring only one deposition and etch step to produce an array of up to 1000 pixels multiplexed onto a single feedline. The LEKID is also a very compact detector making it ideal for producing arrays with high filling factors. The suitability of the LEKID for use in large arrays has prompted a return visit to the IRAM telescope with a dual band instrument in 2010. This presentation will review the progress to date of the LEKIDs development and outline design considerations for producing LEKIDs for future FIR astronomical instruments such as SPICA. Also reviewed will be possible applications for the LEKID outside sub-mm and mm astronomy.

Original languageEnglish (US)
Title of host publicationMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V
DOIs
StatePublished - Sep 7 2010
Externally publishedYes
EventMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V - San Diego, CA, United States
Duration: Jun 29 2010Jul 2 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7741
ISSN (Print)0277-786X

Other

OtherMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V
CountryUnited States
CitySan Diego, CA
Period6/29/107/2/10

Keywords

  • Kinetic Inductance Detectors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A review of the lumped element kinetic inductance detector'. Together they form a unique fingerprint.

  • Cite this

    Doyle, S., Mauskopf, P., Zhang, J., Monfardini, A., Swenson, L., Baselmans, J. J. A., Yates, S. J. C., & Roesch, M. (2010). A review of the lumped element kinetic inductance detector. In Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V [77410M] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7741). https://doi.org/10.1117/12.857341